XPS analysis of sol‐gel processed doped and undoped TiO2 films for sensors

R. Zanoni; G. Righini; A. Montenero; G. Gnappi; G. Montesperelli; E. Traversa; G. Gusmano

doi:10.1002/sia.740220182

XPS analysis of sol‐gel processed doped and undoped TiO₂ films for sensors

R. Zanoni^*, G. Righini, A. Montenero, G. Gnappi, G. Montesperelli, E. Traversa, G. Gusmano

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

We have used x‐ray photoelectron spectroscopy (XPS) to probe the actual surface composition of alkali‐doped and undoped TiO₂ films prepared by the sol‐gel technique. The role of thermal pretreatments, conducted at various temperatures, and the effect of doping with Na are discussed. XPS results are compared with the electrical response of prototype devices having TiO₂ films as the active element, with the help of electrochemical impedance spectroscopy (EIS) measurements.

Original language	English (US)
Pages (from-to)	376-379
Number of pages	4
Journal	Surface and Interface Analysis
Volume	22
Issue number	1-12
DOIs	https://doi.org/10.1002/sia.740220182
State	Published - Jul 1994
Externally published	Yes

ASJC Scopus subject areas

General Chemistry
Condensed Matter Physics
Surfaces and Interfaces
Surfaces, Coatings and Films
Materials Chemistry

Access to Document

10.1002/sia.740220182

Cite this

@article{c5e9dc87338b4fbfba489680c27e1f17,

title = "XPS analysis of sol‐gel processed doped and undoped TiO2 films for sensors",

abstract = "We have used x‐ray photoelectron spectroscopy (XPS) to probe the actual surface composition of alkali‐doped and undoped TiO2 films prepared by the sol‐gel technique. The role of thermal pretreatments, conducted at various temperatures, and the effect of doping with Na are discussed. XPS results are compared with the electrical response of prototype devices having TiO2 films as the active element, with the help of electrochemical impedance spectroscopy (EIS) measurements.",

author = "R. Zanoni and G. Righini and A. Montenero and G. Gnappi and G. Montesperelli and E. Traversa and G. Gusmano",

year = "1994",

month = jul,

doi = "10.1002/sia.740220182",

language = "English (US)",

volume = "22",

pages = "376--379",

journal = "Surface and Interface Analysis",

issn = "0142-2421",

publisher = "Wiley",

number = "1-12",

}

TY - JOUR

T1 - XPS analysis of sol‐gel processed doped and undoped TiO2 films for sensors

AU - Zanoni, R.

AU - Righini, G.

AU - Montenero, A.

AU - Gnappi, G.

AU - Montesperelli, G.

AU - Traversa, E.

AU - Gusmano, G.

PY - 1994/7

Y1 - 1994/7

N2 - We have used x‐ray photoelectron spectroscopy (XPS) to probe the actual surface composition of alkali‐doped and undoped TiO2 films prepared by the sol‐gel technique. The role of thermal pretreatments, conducted at various temperatures, and the effect of doping with Na are discussed. XPS results are compared with the electrical response of prototype devices having TiO2 films as the active element, with the help of electrochemical impedance spectroscopy (EIS) measurements.

AB - We have used x‐ray photoelectron spectroscopy (XPS) to probe the actual surface composition of alkali‐doped and undoped TiO2 films prepared by the sol‐gel technique. The role of thermal pretreatments, conducted at various temperatures, and the effect of doping with Na are discussed. XPS results are compared with the electrical response of prototype devices having TiO2 films as the active element, with the help of electrochemical impedance spectroscopy (EIS) measurements.

UR - http://www.scopus.com/inward/record.url?scp=0028461466&partnerID=8YFLogxK

U2 - 10.1002/sia.740220182

DO - 10.1002/sia.740220182

M3 - Article

AN - SCOPUS:0028461466

SN - 0142-2421

VL - 22

SP - 376

EP - 379

JO - Surface and Interface Analysis

JF - Surface and Interface Analysis

IS - 1-12

ER -

XPS analysis of sol‐gel processed doped and undoped TiO₂ films for sensors

Abstract

ASJC Scopus subject areas

Access to Document

Other files and links

Fingerprint

Cite this