X-ray lithography patterning of magnetic material and their characterization

E. Di Fabrizio; P. Candeloro; R. Kumar; A. Gerardino; L. Vaccari; M. Altissimo; S. Cabrini; L. Businaro; D. Cojoc; F. Feri; F. Romanato; G. Carlotti; G. Gubbiotti

doi:10.1109/IMNC.2002.1178673

X-ray lithography patterning of magnetic material and their characterization

E. Di Fabrizio^*, P. Candeloro, R. Kumar, A. Gerardino, L. Vaccari, M. Altissimo, S. Cabrini, L. Businaro, D. Cojoc, F. Feri, F. Romanato, G. Carlotti, G. Gubbiotti

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

Abstract

Patterned arrays of magnetic wires, dots and anti-dots have attracted a lot of interest both for their potential applications in magnetic data-storage devices and for the investigation of magnetic phenomena in low-dimensional systems. However the employment of micro- and nano-structures in magnetic high density recording media and non-volatile RAM is not trivial: compared to the case of a continuous film, the small size of the islands increases the effects of the demagnetizing field, affecting the static and dynamic magnetic properties. Moreover, some new effects arise due to the lateral confinement of the structures, e.g.: quantized spin-wave modes. These latter effects are of great interest also from a fundamental point of view.

Original language	English (US)
Title of host publication	2002 International Microprocesses and Nanotechnology Conference, MNC 2002
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	322-323
Number of pages	2
ISBN (Electronic)	4891140313, 9784891140311
DOIs	https://doi.org/10.1109/IMNC.2002.1178673
State	Published - 2002
Externally published	Yes
Event	International Microprocesses and Nanotechnology Conference, MNC 2002 - Tokyo, Japan Duration: Nov 6 2002 → Nov 8 2002

Publication series

Name	2002 International Microprocesses and Nanotechnology Conference, MNC 2002

Other

Other	International Microprocesses and Nanotechnology Conference, MNC 2002
Country/Territory	Japan
City	Tokyo
Period	11/6/02 → 11/8/02

Bibliographical note

Publisher Copyright:
© 2002 IEEE.

ASJC Scopus subject areas

Hardware and Architecture
Electrical and Electronic Engineering

Access to Document

10.1109/IMNC.2002.1178673

Cite this

Di Fabrizio, E., Candeloro, P., Kumar, R., Gerardino, A., Vaccari, L., Altissimo, M., Cabrini, S., Businaro, L., Cojoc, D., Feri, F., Romanato, F., Carlotti, G., & Gubbiotti, G. (2002). X-ray lithography patterning of magnetic material and their characterization. In 2002 International Microprocesses and Nanotechnology Conference, MNC 2002 (pp. 322-323). Article 1178673 (2002 International Microprocesses and Nanotechnology Conference, MNC 2002). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/IMNC.2002.1178673

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title = "X-ray lithography patterning of magnetic material and their characterization",

abstract = "Patterned arrays of magnetic wires, dots and anti-dots have attracted a lot of interest both for their potential applications in magnetic data-storage devices and for the investigation of magnetic phenomena in low-dimensional systems. However the employment of micro- and nano-structures in magnetic high density recording media and non-volatile RAM is not trivial: compared to the case of a continuous film, the small size of the islands increases the effects of the demagnetizing field, affecting the static and dynamic magnetic properties. Moreover, some new effects arise due to the lateral confinement of the structures, e.g.: quantized spin-wave modes. These latter effects are of great interest also from a fundamental point of view.",

author = "{Di Fabrizio}, E. and P. Candeloro and R. Kumar and A. Gerardino and L. Vaccari and M. Altissimo and S. Cabrini and L. Businaro and D. Cojoc and F. Feri and F. Romanato and G. Carlotti and G. Gubbiotti",

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doi = "10.1109/IMNC.2002.1178673",

language = "English (US)",

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Di Fabrizio, E, Candeloro, P, Kumar, R, Gerardino, A, Vaccari, L, Altissimo, M, Cabrini, S, Businaro, L, Cojoc, D, Feri, F, Romanato, F, Carlotti, G & Gubbiotti, G 2002, X-ray lithography patterning of magnetic material and their characterization. in 2002 International Microprocesses and Nanotechnology Conference, MNC 2002., 1178673, 2002 International Microprocesses and Nanotechnology Conference, MNC 2002, Institute of Electrical and Electronics Engineers Inc., pp. 322-323, International Microprocesses and Nanotechnology Conference, MNC 2002, Tokyo, Japan, 11/6/02. https://doi.org/10.1109/IMNC.2002.1178673

X-ray lithography patterning of magnetic material and their characterization. / Di Fabrizio, E.; Candeloro, P.; Kumar, R. et al.
2002 International Microprocesses and Nanotechnology Conference, MNC 2002. Institute of Electrical and Electronics Engineers Inc., 2002. p. 322-323 1178673 (2002 International Microprocesses and Nanotechnology Conference, MNC 2002).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

TY - GEN

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AU - Di Fabrizio, E.

AU - Candeloro, P.

AU - Kumar, R.

AU - Gerardino, A.

AU - Vaccari, L.

AU - Altissimo, M.

AU - Cabrini, S.

AU - Businaro, L.

AU - Cojoc, D.

AU - Feri, F.

AU - Romanato, F.

AU - Carlotti, G.

AU - Gubbiotti, G.

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AB - Patterned arrays of magnetic wires, dots and anti-dots have attracted a lot of interest both for their potential applications in magnetic data-storage devices and for the investigation of magnetic phenomena in low-dimensional systems. However the employment of micro- and nano-structures in magnetic high density recording media and non-volatile RAM is not trivial: compared to the case of a continuous film, the small size of the islands increases the effects of the demagnetizing field, affecting the static and dynamic magnetic properties. Moreover, some new effects arise due to the lateral confinement of the structures, e.g.: quantized spin-wave modes. These latter effects are of great interest also from a fundamental point of view.

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BT - 2002 International Microprocesses and Nanotechnology Conference, MNC 2002

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Di Fabrizio E, Candeloro P, Kumar R, Gerardino A, Vaccari L, Altissimo M et al. X-ray lithography patterning of magnetic material and their characterization. In 2002 International Microprocesses and Nanotechnology Conference, MNC 2002. Institute of Electrical and Electronics Engineers Inc. 2002. p. 322-323. 1178673. (2002 International Microprocesses and Nanotechnology Conference, MNC 2002). doi: 10.1109/IMNC.2002.1178673

X-ray lithography patterning of magnetic material and their characterization

Abstract

Publication series

Other

Bibliographical note

ASJC Scopus subject areas

Access to Document

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