Variation tolerant design methods for wideband low noise amplifiers

Arthur Nieuwoudt; Tamer Ragheb; Hamid Nejati; Yehia Massoud

doi:10.1007/s10470-008-9212-7

Variation tolerant design methods for wideband low noise amplifiers

Arthur Nieuwoudt, Tamer Ragheb, Hamid Nejati, Yehia Massoud

Research output: Contribution to journal › Article › peer-review

5 Scopus citations

Abstract

In this paper, we develop design techniques for reducing the impact of manufacturing variations on wideband low noise amplifiers (LNA). Utilizing an efficient modeling and circuit optimization method, we investigate the sensitivity of LNA performance metrics to process variations and determine that the input impedance matching is particularly sensitive to perturbations in component values. To mitigate the impact of process variations on the input impedance matching, we add additional circuit elements and tunable capacitors to dynamically compensate for manufacturing variations after fabrication. The results indicate that the proposed design techniques can increase manufacturing yield by up to one order of magnitude for input impedance matching with only a 14% increase in noise figure. © 2008 Springer Science+Business Media, LLC.

Original language	English (US)
Pages (from-to)	49-54
Number of pages	6
Journal	Analog Integrated Circuits and Signal Processing
Volume	58
Issue number	1
DOIs	https://doi.org/10.1007/s10470-008-9212-7
State	Published - Jan 1 2009
Externally published	Yes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2022-09-13

ASJC Scopus subject areas

Hardware and Architecture
Signal Processing
Surfaces, Coatings and Films

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Cite this

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AU - Ragheb, Tamer

AU - Nejati, Hamid

AU - Massoud, Yehia

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AB - In this paper, we develop design techniques for reducing the impact of manufacturing variations on wideband low noise amplifiers (LNA). Utilizing an efficient modeling and circuit optimization method, we investigate the sensitivity of LNA performance metrics to process variations and determine that the input impedance matching is particularly sensitive to perturbations in component values. To mitigate the impact of process variations on the input impedance matching, we add additional circuit elements and tunable capacitors to dynamically compensate for manufacturing variations after fabrication. The results indicate that the proposed design techniques can increase manufacturing yield by up to one order of magnitude for input impedance matching with only a 14% increase in noise figure. © 2008 Springer Science+Business Media, LLC.

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Variation tolerant design methods for wideband low noise amplifiers

Abstract

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