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Dive into the research topics of 'Variability and reliability in ultra-scaled MOS devices: How should they be evaluated from nanoscale to circuit level?'. Together they form a unique fingerprint.- Sort by
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M. Nafría, R. Rodríguez, M. Porti, J. Martín-Martínez, M. Lanza, X. Aymerich
Research output: Chapter in Book/Report/Conference proceeding › Conference contribution