Understanding strain effects on double-gate FinFET drive-current enhancement, hot-carrier reliability and ring-oscillator delay performance via uniaxial wafer bending experiments

Sagar Suthram*, H. R. Harris, M. M. Hussain, C. Smith, C. D. Young, J. W. Yang, K. Mathews, K. Freeman, P. Majhi, H. H.H. Tseng, R. Jammy, Scott E. Thompson

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

4 Scopus citations

Fingerprint

Dive into the research topics of 'Understanding strain effects on double-gate FinFET drive-current enhancement, hot-carrier reliability and ring-oscillator delay performance via uniaxial wafer bending experiments'. Together they form a unique fingerprint.

Keyphrases

Engineering