Unconventional Face-On Texture and Exceptional In-Plane Order of a High Mobility n-Type Polymer

Jonathan Rivnay, Michael F. Toney, Yan Zheng, Isaac V. Kauvar, Zhihua Chen, Veit Wagner, Antonio Facchetti, Alberto Salleo

Research output: Contribution to journalArticlepeer-review

333 Scopus citations

Abstract

Substantial in-plane crystallinity and dominant face-on stacking are observed in thin films of a high-mobility n-type rylene-thiophene copolymer. Spun films of the polymer, previously thought to have little or no order are found to exhibit an ordered microstructure at both interfaces, and in the bulk. The implications of this type of packing and crystalline morphology are discussed as they relate to thin-film transistors. © 2010 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim.
Original languageEnglish (US)
Pages (from-to)4359-4363
Number of pages5
JournalAdvanced Materials
Volume22
Issue number39
DOIs
StatePublished - Jul 9 2010
Externally publishedYes

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledged KAUST grant number(s): KUS-C1-015-21
Acknowledgements: Portions of this research were carried out at the Stanford Synchrotron Radiation Lightsource, a national user facility operated by Stanford University on behalf of the U.S. Department of Energy, Office of Basic Energy Sciences. A.S. and J.R. gratefully acknowledge financial support from the National Science Foundation in the form of, respectively, a Career Award and a Graduate Student Fellowship. This publication was partially based on work supported by the Center for Advanced Molecular Photovoltaics (Award No KUS-C1-015-21), made by King Abdullah University of Science and Technology (KAUST).
This publication acknowledges KAUST support, but has no KAUST affiliated authors.

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