Abstract
We study the effect of self-assembled monolayer (SAM) treatment of the SiO2 dielectric on the electrical characteristics of PbS transistors. Using SAMs, we observe threshold voltage shifts in the electron transport, allowing us to tune the electrical properties of the devices depending on the SAM molecule used. Moreover, the use of a specific SAM improves the charge carrier mobility in the devices by a factor of three, which is attributed to the reduced interface traps due to passivated silanol on the SiO2 surface. These reduced traps confirm that the voltage shifts are not caused by the trap states induced by the SAMs.
Original language | English (US) |
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Article number | 116105 |
Journal | APL MATERIALS |
Volume | 4 |
Issue number | 11 |
DOIs | |
State | Published - Nov 1 2016 |
Bibliographical note
Funding Information:This work was partly supported by the European Research Council (ERC) Starting Grant (No. 306983) Hybrid solution processable materials for opto-electronic devices (ERC-HySPOD). W.H. and M.S. gratefully acknowledge the use of the services and facilities of the Energie Campus Nurnberg and financial support through the Aufbruch Bayern initiative of the State of Bavaria.
Publisher Copyright:
© 2016 Author(s).
ASJC Scopus subject areas
- General Materials Science
- General Engineering