Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells

Haider Ali, James Bullock, Geoffrey Gregory, Xinbo Yang, Matthew Schneider, Klaus Weber, Ali Javey, Kristopher O. Davis

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations

Abstract

The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO) and hole-selective (molybdenum oxide, MoO; tungsten oxide, WOtextbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.
Original languageEnglish (US)
Title of host publication2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
Pages2192-2194
Number of pages3
ISBN (Print)9781538685297
DOIs
StatePublished - Dec 8 2018

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