Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells

Haider Ali; James Bullock; Geoffrey Gregory; Xinbo Yang; Matthew Schneider; Klaus Weber; Ali Javey; Kristopher O. Davis

doi:10.1109/PVSC.2018.8547689

Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells

Haider Ali, James Bullock, Geoffrey Gregory, Xinbo Yang, Matthew Schneider, Klaus Weber, Ali Javey, Kristopher O. Davis

Physical Sciences and Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO) and hole-selective (molybdenum oxide, MoO; tungsten oxide, WOtextbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.

Original language	English (US)
Title of host publication	2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)
Publisher	Institute of Electrical and Electronics Engineers (IEEE)
Pages	2192-2194
Number of pages	3
ISBN (Print)	9781538685297
DOIs	https://doi.org/10.1109/PVSC.2018.8547689
State	Published - Dec 8 2018

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01

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10.1109/PVSC.2018.8547689

Cite this

Ali, H., Bullock, J., Gregory, G., Yang, X., Schneider, M., Weber, K., Javey, A., & Davis, K. O. (2018). Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC) (pp. 2192-2194). Institute of Electrical and Electronics Engineers (IEEE). https://doi.org/10.1109/PVSC.2018.8547689

Ali, Haider ; Bullock, James ; Gregory, Geoffrey et al. / Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells. 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC). Institute of Electrical and Electronics Engineers (IEEE), 2018. pp. 2192-2194

@inproceedings{b7a9a81ab81c40488681fa5394974d9a,

title = "Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells",

abstract = "The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO) and hole-selective (molybdenum oxide, MoO; tungsten oxide, WOtextbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.",

author = "Haider Ali and James Bullock and Geoffrey Gregory and Xinbo Yang and Matthew Schneider and Klaus Weber and Ali Javey and Davis, {Kristopher O.}",

note = "KAUST Repository Item: Exported on 2020-10-01",

year = "2018",

month = dec,

day = "8",

doi = "10.1109/PVSC.2018.8547689",

language = "English (US)",

isbn = "9781538685297",

pages = "2192--2194",

booktitle = "2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)",

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Ali, H, Bullock, J, Gregory, G, Yang, X, Schneider, M, Weber, K, Javey, A & Davis, KO 2018, Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells. in 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC). Institute of Electrical and Electronics Engineers (IEEE), pp. 2192-2194. https://doi.org/10.1109/PVSC.2018.8547689

Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells. / Ali, Haider; Bullock, James; Gregory, Geoffrey et al.
2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC). Institute of Electrical and Electronics Engineers (IEEE), 2018. p. 2192-2194.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

TY - GEN

T1 - Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells

AU - Ali, Haider

AU - Bullock, James

AU - Gregory, Geoffrey

AU - Yang, Xinbo

AU - Schneider, Matthew

AU - Weber, Klaus

AU - Javey, Ali

AU - Davis, Kristopher O.

N1 - KAUST Repository Item: Exported on 2020-10-01

PY - 2018/12/8

Y1 - 2018/12/8

N2 - The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO) and hole-selective (molybdenum oxide, MoO; tungsten oxide, WOtextbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.

AB - The focus of this work is on the nano-scale characterization of transition metal oxides employed as carrier selective contacts in crystalline silicon (c-Si) solar cells using crosssectional transmission electron microscopy (TEM). Both electronselective (titanium dioxide, TiO) and hole-selective (molybdenum oxide, MoO; tungsten oxide, WOtextbf) contacts were investigated. High-resolution TEM (HRTEM) images were obtained with a FEI Tecnai F30 TEM.

UR - http://hdl.handle.net/10754/631265

UR - https://ieeexplore.ieee.org/document/8547689

UR - http://www.scopus.com/inward/record.url?scp=85059885905&partnerID=8YFLogxK

U2 - 10.1109/PVSC.2018.8547689

DO - 10.1109/PVSC.2018.8547689

M3 - Conference contribution

SN - 9781538685297

SP - 2192

EP - 2194

BT - 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC)

PB - Institute of Electrical and Electronics Engineers (IEEE)

ER -

Ali H, Bullock J, Gregory G, Yang X, Schneider M, Weber K et al. Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells. In 2018 IEEE 7th World Conference on Photovoltaic Energy Conversion (WCPEC) (A Joint Conference of 45th IEEE PVSC, 28th PVSEC & 34th EU PVSEC). Institute of Electrical and Electronics Engineers (IEEE). 2018. p. 2192-2194 doi: 10.1109/PVSC.2018.8547689

Transmission Electron Microscopy Studies of Transition Metal Oxides Employed as Carrier Selective Contacts in Silicon Solar Cells

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