Transmission electron microscope sample alignment system and method

Daliang Zhang; Yu Han; Kun Li; Yihan Zhu

Transmission electron microscope sample alignment system and method

Daliang Zhang (Inventor), Yu Han (Inventor), Kun Li (Inventor), Yihan Zhu (Inventor)

Research output: Patent

Abstract

A system and method involve applying an electron beam to a sample and obtaining an image of the sample with the applied electron beam. An orientation of the sample relative to the sample's zone axis is automatically determined based on a distribution of reflections in the image. The orientation of the sample is automatically adjusted to align with the sample's zone axis based on the determined orientation.

Original language	English (US)
Patent number	US10067078B1
State	Published - Sep 4 2018

Bibliographical note

KAUST Repository Item: Exported on 2019-02-13

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https://repository.kaust.edu.sa/bitstream/10754/629822/1/US10067078.pdf

Cite this

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title = "Transmission electron microscope sample alignment system and method",

abstract = "A system and method involve applying an electron beam to a sample and obtaining an image of the sample with the applied electron beam. An orientation of the sample relative to the sample's zone axis is automatically determined based on a distribution of reflections in the image. The orientation of the sample is automatically adjusted to align with the sample's zone axis based on the determined orientation.",

author = "Daliang Zhang and Yu Han and Kun Li and Yihan Zhu",

note = "KAUST Repository Item: Exported on 2019-02-13; US10067078B1",

year = "2018",

month = sep,

day = "4",

language = "English (US)",

type = "Patent",

}

TY - PAT

T1 - Transmission electron microscope sample alignment system and method

AU - Zhang, Daliang

AU - Han, Yu

AU - Li, Kun

AU - Zhu, Yihan

N1 - KAUST Repository Item: Exported on 2019-02-13

PY - 2018/9/4

Y1 - 2018/9/4

N2 - A system and method involve applying an electron beam to a sample and obtaining an image of the sample with the applied electron beam. An orientation of the sample relative to the sample's zone axis is automatically determined based on a distribution of reflections in the image. The orientation of the sample is automatically adjusted to align with the sample's zone axis based on the determined orientation.

AB - A system and method involve applying an electron beam to a sample and obtaining an image of the sample with the applied electron beam. An orientation of the sample relative to the sample's zone axis is automatically determined based on a distribution of reflections in the image. The orientation of the sample is automatically adjusted to align with the sample's zone axis based on the determined orientation.

UR - http://hdl.handle.net/10754/629822

UR - https://patents.google.com/patent/US10067078B1/en

M3 - Patent

M1 - US10067078B1

ER -

Transmission electron microscope sample alignment system and method

Abstract

Bibliographical note

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