Towards the modeling of GaAs based 850 nm VCSEL with oxide confinement

S. M. Mitani, M. S. Alias, M. R. Yahya, A. F.A. Mat

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

Fingerprint

Dive into the research topics of 'Towards the modeling of GaAs based 850 nm VCSEL with oxide confinement'. Together they form a unique fingerprint.

Engineering

Material Science