Topological darkness revisited: A four-dimensional picture

Haomin Song, Xie Zeng, Dengxin Ji, Nan Zhang, Kai Liu, Qiaoqiang Gan

Research output: Chapter in Book/Report/Conference proceedingConference contribution


We present a complete description of 'topological darkness' in a four-dimensional space regarding optical constants (i.e. n and k) of effective media, wavelengths and incident angles, which is essential for enhanced light-matter interaction in thin-films.
Original languageEnglish (US)
Title of host publicationConference on Lasers and Electro-Optics Europe - Technical Digest
PublisherInstitute of Electrical and Electronics Engineers Inc.
ISBN (Print)9781557529688
StatePublished - Aug 10 2015
Externally publishedYes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2022-09-13


Dive into the research topics of 'Topological darkness revisited: A four-dimensional picture'. Together they form a unique fingerprint.

Cite this