TY - PAT
T1 - Thermal History Devices, Systems For Thermal History Detection, And Methods For Thermal History Detection
AU - Caraveo-Frescas, Jesus Alfonso
AU - Alshareef, Husam N.
N1 - KAUST Repository Item: Exported on 2019-02-13
PY - 2015/5/28
Y1 - 2015/5/28
N2 - Embodiments of the present disclosure include nanowire field-effect transistors, systems for temperature history detection, methods for thermal history detection, a matrix of field effect transistors, and the like.
AB - Embodiments of the present disclosure include nanowire field-effect transistors, systems for temperature history detection, methods for thermal history detection, a matrix of field effect transistors, and the like.
UR - http://hdl.handle.net/10754/595379
UR - http://appft.uspto.gov/netacgi/nph-Parser?Sect1=PTO1&Sect2=HITOFF&d=PG01&p=1&u=%2Fnetahtml%2FPTO%2Fsrchnum.html&r=1&f=G&l=50&s1=%2220150146761%22.PGNR.&OS=DN/20150146761&RS=DN/20150146761
UR - http://assignment.uspto.gov/#/search?adv=publNum:20150146761
UR - http://www.google.com/patents/US20150146761
UR - http://worldwide.espacenet.com/publicationDetails/biblio?CC=US&NR=2015146761A1&KC=A1&FT=D
M3 - Patent
M1 - US9976913B2
ER -