Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam

Seyedhamidreza Alaie; Drew F. Goettler; Yingbing Jiang; Khawar Abbas; Mohammadhosein Ghasemi Baboly; Dalaver H. Anjum; Saharoui Chaieb; Zayd Chad Leseman

doi:10.1088/0957-4484/26/8/085704

Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam

Seyedhamidreza Alaie, Drew F. Goettler, Yingbing Jiang, Khawar Abbas, Mohammadhosein Ghasemi Baboly, Dalaver H. Anjum, Saharoui Chaieb, Zayd Chad Leseman

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6 Scopus citations

Abstract

Pt deposited by focused ion beam (FIB) is a common material used for attachment of nanosamples, repair of integrated circuits, and synthesis of nanostructures. Despite its common use little information is available on its thermal properties. In this work, Pt deposited by FIB is characterized thermally, structurally, and chemically. Its thermal conductivity is found to be substantially lower than the bulk value of Pt, 7.2 W m-1 K-1 versus 71.6 W m-1 K-1 at room temperature. The low thermal conductivity is attributed to the nanostructure of the material and its chemical composition. Pt deposited by FIB is shown, via aberration corrected TEM, to be a segregated mix of nanocrystalline Pt and amorphous C with Ga and O impurities. Ga impurities mainly reside in the Pt while O is homogeneously distributed throughout. The Ga impurity, small grain size of the Pt, and the amorphous carbon between grains are the cause for the low thermal conductivity of this material. Since Pt deposited by FIB is a common material for affixing samples, this information can be used to assess systematic errors in thermal characterization of different nanosamples. This application is also demonstrated by thermal characterization of two carbon nanofibers and a correction using the reported thermal properties of the Pt deposited by FIB.

Original language	English (US)
Pages (from-to)	085704
Journal	Nanotechnology
Volume	26
Issue number	8
DOIs	https://doi.org/10.1088/0957-4484/26/8/085704
State	Published - Feb 4 2015

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledgements: This work was supported by the Office of Basic Energy Sciences, Division of Materials Sciences and Engineering Experimental Program to Stimulate Competitive Research (EPSCoR) under Award DE-FG02-10ER46720. Portions of this work were carried out in the Manufacturing Training and Technology Center (MTTC), Center for MicroEngineered Materials' (CMEM) TEM Laboratory, and the Nanosynthesis Facility all at the University of New Mexico. SC thanks the King Abdullah University for Science and Technology (KAUST) for financial support.

ASJC Scopus subject areas

Bioengineering
Mechanics of Materials
General Materials Science
General Chemistry
Mechanical Engineering
Electrical and Electronic Engineering

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10.1088/0957-4484/26/8/085704

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@article{f3d75cea0ecd4080a08fd8f952b7017d,

title = "Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam",

abstract = "Pt deposited by focused ion beam (FIB) is a common material used for attachment of nanosamples, repair of integrated circuits, and synthesis of nanostructures. Despite its common use little information is available on its thermal properties. In this work, Pt deposited by FIB is characterized thermally, structurally, and chemically. Its thermal conductivity is found to be substantially lower than the bulk value of Pt, 7.2 W m-1 K-1 versus 71.6 W m-1 K-1 at room temperature. The low thermal conductivity is attributed to the nanostructure of the material and its chemical composition. Pt deposited by FIB is shown, via aberration corrected TEM, to be a segregated mix of nanocrystalline Pt and amorphous C with Ga and O impurities. Ga impurities mainly reside in the Pt while O is homogeneously distributed throughout. The Ga impurity, small grain size of the Pt, and the amorphous carbon between grains are the cause for the low thermal conductivity of this material. Since Pt deposited by FIB is a common material for affixing samples, this information can be used to assess systematic errors in thermal characterization of different nanosamples. This application is also demonstrated by thermal characterization of two carbon nanofibers and a correction using the reported thermal properties of the Pt deposited by FIB.",

author = "Seyedhamidreza Alaie and Goettler, {Drew F.} and Yingbing Jiang and Khawar Abbas and Baboly, {Mohammadhosein Ghasemi} and Anjum, {Dalaver H.} and Saharoui Chaieb and Leseman, {Zayd Chad}",

note = "KAUST Repository Item: Exported on 2020-10-01 Acknowledgements: This work was supported by the Office of Basic Energy Sciences, Division of Materials Sciences and Engineering Experimental Program to Stimulate Competitive Research (EPSCoR) under Award DE-FG02-10ER46720. Portions of this work were carried out in the Manufacturing Training and Technology Center (MTTC), Center for MicroEngineered Materials' (CMEM) TEM Laboratory, and the Nanosynthesis Facility all at the University of New Mexico. SC thanks the King Abdullah University for Science and Technology (KAUST) for financial support.",

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doi = "10.1088/0957-4484/26/8/085704",

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T1 - Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam

AU - Alaie, Seyedhamidreza

AU - Goettler, Drew F.

AU - Jiang, Yingbing

AU - Abbas, Khawar

AU - Baboly, Mohammadhosein Ghasemi

AU - Anjum, Dalaver H.

AU - Chaieb, Saharoui

AU - Leseman, Zayd Chad

N1 - KAUST Repository Item: Exported on 2020-10-01 Acknowledgements: This work was supported by the Office of Basic Energy Sciences, Division of Materials Sciences and Engineering Experimental Program to Stimulate Competitive Research (EPSCoR) under Award DE-FG02-10ER46720. Portions of this work were carried out in the Manufacturing Training and Technology Center (MTTC), Center for MicroEngineered Materials' (CMEM) TEM Laboratory, and the Nanosynthesis Facility all at the University of New Mexico. SC thanks the King Abdullah University for Science and Technology (KAUST) for financial support.

PY - 2015/2/4

Y1 - 2015/2/4

N2 - Pt deposited by focused ion beam (FIB) is a common material used for attachment of nanosamples, repair of integrated circuits, and synthesis of nanostructures. Despite its common use little information is available on its thermal properties. In this work, Pt deposited by FIB is characterized thermally, structurally, and chemically. Its thermal conductivity is found to be substantially lower than the bulk value of Pt, 7.2 W m-1 K-1 versus 71.6 W m-1 K-1 at room temperature. The low thermal conductivity is attributed to the nanostructure of the material and its chemical composition. Pt deposited by FIB is shown, via aberration corrected TEM, to be a segregated mix of nanocrystalline Pt and amorphous C with Ga and O impurities. Ga impurities mainly reside in the Pt while O is homogeneously distributed throughout. The Ga impurity, small grain size of the Pt, and the amorphous carbon between grains are the cause for the low thermal conductivity of this material. Since Pt deposited by FIB is a common material for affixing samples, this information can be used to assess systematic errors in thermal characterization of different nanosamples. This application is also demonstrated by thermal characterization of two carbon nanofibers and a correction using the reported thermal properties of the Pt deposited by FIB.

AB - Pt deposited by focused ion beam (FIB) is a common material used for attachment of nanosamples, repair of integrated circuits, and synthesis of nanostructures. Despite its common use little information is available on its thermal properties. In this work, Pt deposited by FIB is characterized thermally, structurally, and chemically. Its thermal conductivity is found to be substantially lower than the bulk value of Pt, 7.2 W m-1 K-1 versus 71.6 W m-1 K-1 at room temperature. The low thermal conductivity is attributed to the nanostructure of the material and its chemical composition. Pt deposited by FIB is shown, via aberration corrected TEM, to be a segregated mix of nanocrystalline Pt and amorphous C with Ga and O impurities. Ga impurities mainly reside in the Pt while O is homogeneously distributed throughout. The Ga impurity, small grain size of the Pt, and the amorphous carbon between grains are the cause for the low thermal conductivity of this material. Since Pt deposited by FIB is a common material for affixing samples, this information can be used to assess systematic errors in thermal characterization of different nanosamples. This application is also demonstrated by thermal characterization of two carbon nanofibers and a correction using the reported thermal properties of the Pt deposited by FIB.

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U2 - 10.1088/0957-4484/26/8/085704

DO - 10.1088/0957-4484/26/8/085704

M3 - Article

SN - 0957-4484

VL - 26

SP - 085704

JO - Nanotechnology

JF - Nanotechnology

IS - 8

ER -

Thermal conductivity and nanocrystalline structure of platinum deposited by focused ion beam

Abstract

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