The electrical performances of the heterojunction of n-ZnO nanowires with p-Si substrate at the nanometer scale have been characterized using an ultrahigh-vacuum conducting atomic force microscopy. Compared with the expected values of 1.0-2.0 reported in p-n junction in the previous studies, the abnormally high diode ideality factor (2) was obtained. It elucidates that a ZnO-Si p-n junction can be modeled by a series of diodes, the actual ZnO-Si junction diode and two Schottky diodes at the metal/ZnO and metal/Si junctions. The tunneling across p-n junction would also play a role in the externally measured high ideality factor.
Bibliographical noteFunding Information:
The research was supported by the National Science Council under Grant No. NSC 96-2112-M-002-038-MY3 and NSC 96-2622-M-002-002-CC3.
ASJC Scopus subject areas
- Physics and Astronomy (miscellaneous)