The silane depletion fraction as an indicator for the amorphous/crystalline silicon interface passivation quality

A. Descoeudres*, L. Barraud, R. Bartlome, G. Choong, Stefaan De Wolf, F. Zicarelli, C. Ballif

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

95 Scopus citations

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