Abstract
We propose a new structural model for the Al(1 1 1)/Al2O 3(0 0 0 1) interface based on density functional theory calculations. The ultrathin interface structure is shown to consist of two Al layers, one that is oxide-like and the other metal-like. Our model interface reproduces the barrier height to the oxide conduction band edge and predicts the oxide overlayer to lower the metal work function by 0.49 eV.
Original language | English (US) |
---|---|
Pages (from-to) | 569-574 |
Number of pages | 6 |
Journal | Organic Electronics |
Volume | 14 |
Issue number | 2 |
DOIs | |
State | Published - Feb 2013 |
Externally published | Yes |
Keywords
- Aluminum
- Aluminum oxide
- Density functional theory
- Interface structure
- Interfacial level alignment
- Work function
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Biomaterials
- General Chemistry
- Condensed Matter Physics
- Materials Chemistry
- Electrical and Electronic Engineering