The Impact of Surface Roughness on Avalanche Frequency

Research output: Chapter in Book/Report/Conference proceedingConference contribution

2 Scopus citations


IMPATT diodes were designed and fabricated in standard CMOS technology to study the impact of the RMS value of surface roughness on the avalanche frequency. By comparing the on-chip measurements of an IMPATT diode integrated in a CPW to an integrated one with a microstrip patch antenna at the same biasing conditions, the results demonstrated a reduction in the avalanche frequency in the antenna integrated structure by 34% compared to the CPW one. Such variation is strongly associated with the increase in the conduction losses by 40%~80% based on the biasing conditions and hence the avalanche frequency.
Original languageEnglish (US)
Title of host publication2019 International Applied Computational Electromagnetics Society Symposium (ACES)
PublisherInstitute of Electrical and Electronics Engineers (IEEE)
StatePublished - May 13 2019

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01


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