Abstract
The near band edge emission of the tensile-strained m-plane ZnO film grown on (112)LaAlO3 substrates shows abnormal low polarization degree (ρ = 0.1). The temperature dependency of polarization degree clarifies the origins of different emission peaks. In tensile-strained m-plane ZnO, the [0001] polarized state is upper shifted and is overlapping with the [112̅0] polarized state. This phenomenon causes the abnormal low polarization degree and reveals the effect of strain on the emission anisotropy of m-plane ZnO.
Original language | English (US) |
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Pages (from-to) | 1-8 |
Number of pages | 8 |
Journal | IEEE Photonics Journal |
Volume | 7 |
Issue number | 2 |
DOIs | |
State | Published - Mar 20 2015 |