Abstract
X-ray photoelectron spectroscopy has become a true microscopic technique at third generation soft X-ray synchrotron sources, finding applications in many domains of academic and applied research. This paper describes the present status of scanning photoemission microscopy, where by using photon optics the photon beam can be focused to micron or submicron dimensions and imaging or spectroscopy can be performed. It discusses different photon focusing optical elements and describes the major components of the constructed scanning microscopes. The applications of imaging and spectroscopy with high lateral resolution in surface science are illustrated, and some recent results obtained in different laboratories are briefly reviewed.
| Original language | English |
|---|---|
| Pages (from-to) | 265-286 |
| Number of pages | 22 |
| Journal | Surface Review and Letters |
| Volume | 6 |
| Issue number | 2 |
| State | Published - Apr 1999 |
| Externally published | Yes |
Keywords
- X-RAY MICROSCOPE
- ENERGY-ELECTRON-MICROSCOPE
- PHOTOELECTRON MICROSCOPY
- ESCA MICROSCOPY
- EMISSION MICROSCOPY
- MAGNETIC DOMAINS
- HIGH-RESOLUTION
- LIGHT-SOURCE
- ZONE PLATES
- MAX-LAB