Surface chemistry of Ru: Relevance to optics lifetime in EUVL

R. Wasielewski, B. V. Yakshinskiy, M. N. Hedhili, A. Ciszewski, T. E. Madey*

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

17 Scopus citations

Abstract

Ruthenium capping layers ∼2 nm thick are used to protect and extend the lifetimes of Si/Mo multilayer mirrors used in extreme ultraviolet lithography (EUVL) applications. In the present work, we use ultrahigh vacuum surface science methods to address two aspects of Ru surface chemistry: (a) use of atomic hydrogen to remove oxygen from O-covered Ru, and (b) the effects of a model background hydrocarbon gas (methyl methacrylate, MMA) on the accumulation of carbon on a Ru(101̄0) single crystal surface. Atomic H is very effective in removing O from Ru even at 300K; the interpretation is that H reacts directly with adsorbed O to make OH, and a subsequent H atom reacts with OH to make H 2O, which desorbs at 300K. MMA adsorbs strongly on Ru in the first monolayer and dissociates upon heating; H 2 and CO desorption products are seen upon heating from 300 to 600K, while a fractional monolayer of C remains on the surface. Physisorbed multilayers of MMA form at temperatures below ∼170K. Thermal desorption of MMA dosed onto O-covered Ru shows that MMA reacts and completely removes an adsorbed O monolayer upon heating. Electron bombardment of MMA/Ru causes polymerization and also can induce accumulation of carbon - all depends on electron fluence, partial pressure of MMA, and substrate temperature.

Original languageEnglish (US)
Title of host publicationEMLC 2007
Subtitle of host publication23rd European Mask and Lithography Conference
DOIs
StatePublished - 2007
Externally publishedYes
EventEMLC 2007: 23rd European Mask and Lithography Conference - Grenoble, France
Duration: Jan 22 2007Jan 25 2007

Publication series

NameProceedings of SPIE - The International Society for Optical Engineering
Volume6533
ISSN (Print)0277-786X

Other

OtherEMLC 2007: 23rd European Mask and Lithography Conference
Country/TerritoryFrance
CityGrenoble
Period01/22/0701/25/07

Keywords

  • Atomic H
  • EUV optics contamination
  • EUV optics lifetime
  • Electron induced reactions
  • Extreme ultraviolet lithography (EUVL)
  • Hydrogen
  • Methyl methacrylate (MMA)
  • Oxygen
  • Ru(101̄0)
  • Ruthenium

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Computer Science Applications
  • Applied Mathematics
  • Electrical and Electronic Engineering

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