Superficial tissue optical property determination using spatially resolved measurements close to the source: comparison with frequency domain photon migration measurements

Frederic Bevilacqua*, Dominique Piguet, Pierre Marquet, Jeffrey D. Gross, Dorota Jakubowski, Vasan Venugopalan, Bruce J. Tromberg, Christian Depeursinge

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

8 Scopus citations

Abstract

Local and superficial optical property characterization of biological tissues can be performed by measuring spatially-resolved diffuse reflectance at small source-detector separations. Monte Carlo simulations and experiments were performed to assess the performance of a spatially-resolved reflectance probe, employing multiple detector fibers (0.3 to 1.4 mm from the source). Under these conditions, the inverse problem, i.e. calculating the absorption and reduced scattering coefficients, is necessarily sensitive to the phase function. This effect must be taken into account by considering a new parameter of the phase function, which depends on the first and second moments of the phase function. Probe performance is compared to another technique for quantitatively measuring optical coefficients, based on the analysis of photon density waves (Frequency Domain Photon Migration). The two techniques are found to be in reasonable agreement. However, the spatially resolved probe shows optimum measurement sensitivity in the volume immediately beneath the probe, while FDPM typically samples much larger regions of tissues. Measurements on human brain in vivo are reported using both methods.

Original languageEnglish (US)
Pages (from-to)540-547
Number of pages8
JournalProceedings of SPIE - The International Society for Optical Engineering
Volume3597
StatePublished - 1999
Externally publishedYes
EventProceedings of the 1999 Optical Tomography and Spectroscopy of Tissue III - San Jose, CA, USA
Duration: Jan 24 1999Jan 28 1999

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Applied Mathematics
  • Electrical and Electronic Engineering
  • Computer Science Applications

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