Subwavelength plasmonic bragg reflector structures for on-chip optoelectronic applications

Amir Hosseini, Yehia Massoud

Research output: Chapter in Book/Report/Conference proceedingConference contribution

8 Scopus citations


In this paper, we present a new plasmonic Bragg reflector with high reflectance efficiency in the optical frequency range. This structure is based on dielectric thickness modulation in the metal-insulator-metal (MIM) geometry which provides subwavelength light confinement and is suitable for high integration. We investigate and compare the performance of the presented structure with a previously proposed MIM-based reflector. We find that the reflector structures consisting of periodic change in their dielectric materials provide narrow band-gaps, and therefore are more appropriate for filtering applications. On the other hand, with the same effective index contrast, dielectric thickness modulation results in wider band-gaps and higher reflectance at frequencies inside the gap. © 2007 IEEE.
Original languageEnglish (US)
Title of host publicationProceedings - IEEE International Symposium on Circuits and Systems
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages4
StatePublished - Jan 1 2007
Externally publishedYes

Bibliographical note

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