Study of optical properties of metallic Aux(SiO2)1-x and Nix(SiO2)1-x films

Y. Wang*, X. X. Zhang, X. Yan, R. J. Zhang, L. Y. Chen, Y. X. Zheng, S. Y. Wang, S. M. Zhou, Y. M. Yang, N. Dai

*Corresponding author for this work

Research output: Contribution to journalConference articlepeer-review

3 Scopus citations


To study the optical properties of the metal-insulator granular films, a series of Nix(SiO2)1-x and Aux(SiO2)1-x granular films was made with a variation of x and the annealing process. The complex dielectric function was measured in the 1.5-4.8-eV photon energy range. New spectral features were found in the dielectric functions. For Aux(SiO2)1-x samples, a new peak in the ε2 spectra is seen around 2 eV, especially for x = 0.67. The ε1 spectra change continuously from positive to negative in the low photon energy range, resulting in a true zero of ε1 associated with the plasmon occurring at 2.0-2.5 eV and at about 3.6 eV for the Au- and Ni-based films, respectively. Compared to previous data, the experimental results obtained in this work provide richer information to understand better the optical properties of the metal-granular films that are not well predicted by the theoretical model. The effect will be useful in the metallic multilayer structure design and applications.

Original languageEnglish (US)
Pages (from-to)113-115
Number of pages3
JournalPhysica B: Condensed Matter
Issue number1-3
StatePublished - Apr 2000
Externally publishedYes
EventThe 5th International Conference on Electrical Transport and Optical Properties of Inhomogeneous Media (ETOPIM5) - Kowloon Tong, Hong Kong
Duration: Jun 21 1999Jun 25 1999

Bibliographical note

Funding Information:
This work was supported by NSF and STCSM of China.

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Condensed Matter Physics
  • Electrical and Electronic Engineering


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