Abstract
The current trend of over-parameterized Deep Neural Networks makes the deployment on resource constrained systems challenging. To deal with this, optimization techniques, such as network pruning, can be adopted. We propose a novel pruning technique based on trainable probability masks that, when binarized, select the elements of the network to prune. Our method features i) an automatic selections of the elements to prune by jointly training the binary masks with the model, ii) the capability of controlling the pruning level through hyper-parameters of a novel regularization term. We assess the effectiveness of our method by employing it in the structured pruning of the fully connected layers of shallow and deep neural networks where it outperforms the magnitude-based pruning approaches.
Original language | English (US) |
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Title of host publication | 2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 1020-1024 |
Number of pages | 5 |
ISBN (Electronic) | 9798350302103 |
DOIs | |
State | Published - 2023 |
Event | 2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023 - Tempe, United States Duration: Aug 6 2023 → Aug 9 2023 |
Publication series
Name | Midwest Symposium on Circuits and Systems |
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ISSN (Print) | 1548-3746 |
Conference
Conference | 2023 IEEE 66th International Midwest Symposium on Circuits and Systems, MWSCAS 2023 |
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Country/Territory | United States |
City | Tempe |
Period | 08/6/23 → 08/9/23 |
Bibliographical note
Publisher Copyright:© 2023 IEEE.
Keywords
- Deep Neural Network
- Network Pruning
- Probability Mask
- Trainable Binary Mask
ASJC Scopus subject areas
- Electronic, Optical and Magnetic Materials
- Electrical and Electronic Engineering