Stress release and defect occurrence in V1-xFe x films upon hydrogen loading: H-induced superabundant vacancies, movement and creation of dislocations

Material Science

• Liquid Films 100%
• Dislocation 100%
• Stress Relaxation 33%
• Defect 33%
• X-Ray Diffraction 33%
• Vacancy 33%
• Ultimate Tensile Strength 33%
• Thin Films 16%
• Expansion 16%

Physics

• Hydrogen 66%
• Plane 50%
• Plastic Deformation 33%
• Defects 33%
• Thin Films 16%
• Interstitials 16%
• Curvature 16%
• Acoustic Emission 16%
• Temperature 16%
• Substrates 16%
• High Temperature 16%
• Sites 16%
• Emission 16%
• Events 16%
• Expansion 16%