Spatially-Resolved Thermometry of Filamentary Nanoscale Hot Spots in TiO2 Resistive Random Access Memories to Address Device Variability

Timm Swoboda, Xing Gao, Carlos M.M. Rosário, Fei Hui, Kaichen Zhu, Yue Yuan, Sanchit Deshmukh, Çaǧıl Köroǧlu, Eric Pop, Mario Lanza, Hans Hilgenkamp, Miguel Muñoz Rojo*

*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

3 Scopus citations

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