Abstract
We have investigated the hole-injection characteristics from indium tin-oxide (ITO) into 4,4′,4 ″-trisN,-(3-methylphenyl)-N-phenylaminotriphenylamine (m-MTDATA) and have measured the hole-carrier drift mobility of this compound in single-layer ITO/m-MTDATA/Au structures. We have found that ITO is able to provide trap-free space-charge-limited currents over a wide range of film thicknesses and have established unambiguously that the ITO/m-MTDATA is an ideal Ohmic contact at high electric fields. Our observations clarify the role of m-MTDATA as a voltage-lowering hole-injecting buffer layer in organic light-emitting diodes. © 1998 American Institute of Physics.
Original language | English (US) |
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Journal | Applied Physics Letters |
Volume | 72 |
Issue number | 19 |
DOIs | |
State | Published - Dec 1 1998 |
Externally published | Yes |