Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale

Naresh Kumar; Alina Zoladek-Lemanczyk; Anne A. Y. Guilbert; Weitao Su; Sachetan M. Tuladhar; Thomas Kirchartz; Bob C. Schroeder; Iain McCulloch; Jenny Nelson; Debdulal Roy; Fernando A. Castro

doi:10.1039/c6nr09057e

Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale

Naresh Kumar, Alina Zoladek-Lemanczyk, Anne A. Y. Guilbert, Weitao Su, Sachetan M. Tuladhar, Thomas Kirchartz, Bob C. Schroeder, Iain McCulloch, Jenny Nelson, Debdulal Roy, Fernando A. Castro

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29 Scopus citations

Abstract

Novel optoelectronic devices rely on complex nanomaterial systems where the nanoscale morphology and local chemical composition are critical to performance. However, the lack of analytical techniques that can directly probe these structure-property relationships at the nanoscale presents a major obstacle to device development. In this work, we present a novel method for non-destructive, simultaneous mapping of the morphology, chemical composition and photoelectrical properties with

Original language	English (US)
Pages (from-to)	2723-2731
Number of pages	9
Journal	Nanoscale
Volume	9
Issue number	8
DOIs	https://doi.org/10.1039/c6nr09057e
State	Published - 2017

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledgements: The authors acknowledge funding from the Technology Strategy Board (TSB) SCALLOPS project, UK. NK, AZL, DR, and FAC acknowledge funding from the UK Department of Business Innovation and Skills, through the National Measurement System. JN acknowledges the support of the Engineering and Physical Sciences Research Council via grants EP/K030671/1, EP/K029843/1 and the Supersolar Energy Hub (EP/J017361/1), and The Royal Society via a Wolfson Merit Award.

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@article{9d65fa7f1f2f44cababc9bbcb70c2621,

title = "Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale",

abstract = "Novel optoelectronic devices rely on complex nanomaterial systems where the nanoscale morphology and local chemical composition are critical to performance. However, the lack of analytical techniques that can directly probe these structure-property relationships at the nanoscale presents a major obstacle to device development. In this work, we present a novel method for non-destructive, simultaneous mapping of the morphology, chemical composition and photoelectrical properties with",

author = "Naresh Kumar and Alina Zoladek-Lemanczyk and Guilbert, {Anne A. Y.} and Weitao Su and Tuladhar, {Sachetan M.} and Thomas Kirchartz and Schroeder, {Bob C.} and Iain McCulloch and Jenny Nelson and Debdulal Roy and Castro, {Fernando A.}",

note = "KAUST Repository Item: Exported on 2020-10-01 Acknowledgements: The authors acknowledge funding from the Technology Strategy Board (TSB) SCALLOPS project, UK. NK, AZL, DR, and FAC acknowledge funding from the UK Department of Business Innovation and Skills, through the National Measurement System. JN acknowledges the support of the Engineering and Physical Sciences Research Council via grants EP/K030671/1, EP/K029843/1 and the Supersolar Energy Hub (EP/J017361/1), and The Royal Society via a Wolfson Merit Award.",

year = "2017",

doi = "10.1039/c6nr09057e",

language = "English (US)",

volume = "9",

pages = "2723--2731",

journal = "Nanoscale",

issn = "2040-3364",

publisher = "Royal Society of Chemistry",

number = "8",

}

TY - JOUR

T1 - Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale

AU - Kumar, Naresh

AU - Zoladek-Lemanczyk, Alina

AU - Guilbert, Anne A. Y.

AU - Su, Weitao

AU - Tuladhar, Sachetan M.

AU - Kirchartz, Thomas

AU - Schroeder, Bob C.

AU - McCulloch, Iain

AU - Nelson, Jenny

AU - Roy, Debdulal

AU - Castro, Fernando A.

N1 - KAUST Repository Item: Exported on 2020-10-01 Acknowledgements: The authors acknowledge funding from the Technology Strategy Board (TSB) SCALLOPS project, UK. NK, AZL, DR, and FAC acknowledge funding from the UK Department of Business Innovation and Skills, through the National Measurement System. JN acknowledges the support of the Engineering and Physical Sciences Research Council via grants EP/K030671/1, EP/K029843/1 and the Supersolar Energy Hub (EP/J017361/1), and The Royal Society via a Wolfson Merit Award.

PY - 2017

Y1 - 2017

N2 - Novel optoelectronic devices rely on complex nanomaterial systems where the nanoscale morphology and local chemical composition are critical to performance. However, the lack of analytical techniques that can directly probe these structure-property relationships at the nanoscale presents a major obstacle to device development. In this work, we present a novel method for non-destructive, simultaneous mapping of the morphology, chemical composition and photoelectrical properties with

AB - Novel optoelectronic devices rely on complex nanomaterial systems where the nanoscale morphology and local chemical composition are critical to performance. However, the lack of analytical techniques that can directly probe these structure-property relationships at the nanoscale presents a major obstacle to device development. In this work, we present a novel method for non-destructive, simultaneous mapping of the morphology, chemical composition and photoelectrical properties with

UR - http://hdl.handle.net/10754/622801

UR - http://pubs.rsc.org/en/Content/ArticleLanding/2017/NR/C6NR09057E#!divAbstract

UR - http://www.scopus.com/inward/record.url?scp=85013874558&partnerID=8YFLogxK

U2 - 10.1039/c6nr09057e

DO - 10.1039/c6nr09057e

M3 - Article

C2 - 28078339

SN - 2040-3364

VL - 9

SP - 2723

EP - 2731

JO - Nanoscale

JF - Nanoscale

IS - 8

ER -

Simultaneous topographical, electrical and optical microscopy of optoelectronic devices at the nanoscale

Abstract

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