The goal of this work was to extend the FASTHENRY 3-D inductance extraction program to include the finite conductivity of a semiconductor substrate, and then use the modified program to investigate a variety of on-chip inductive effects. In addition, the limitations of a simple two-loop model for estimating coupling inductance is examined.
|Original language||English (US)|
|Title of host publication||Technical Digest - International Electron Devices Meeting|
|Publisher||IEEEPiscataway, NJ, United States|
|Number of pages||4|
|State||Published - Dec 1 1995|