Abstract
This paper presents the design and implementation of an integrated balun for testing 24 GHz on-chip differential antennas. The balun is completely characterized on lossy Si substrate for subsequent de-embedding of the antenna impedance. A simple de-embedding technique is developed and verified to extract differential antenna impedance from single-ended S-parameters. The gain of the on-chip antennas is estimated through a novel gain calibration technique.
Original language | English (US) |
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Title of host publication | Antem/URSI 2004 - 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, Proceedings |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
ISBN (Electronic) | 9780969256397 |
DOIs | |
State | Published - 2004 |
Externally published | Yes |
Event | 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, Antem/URSI 2004 - Ottawa, Canada Duration: Jul 20 2004 → Jul 23 2004 |
Publication series
Name | Antem/URSI 2004 - 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, Proceedings |
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Other
Other | 10th International Symposium on Antenna Technology and Applied Electromagnetics and URSI Conference, Antem/URSI 2004 |
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Country/Territory | Canada |
City | Ottawa |
Period | 07/20/04 → 07/23/04 |
Bibliographical note
Publisher Copyright:© 2004 IEEE.
ASJC Scopus subject areas
- Electrical and Electronic Engineering
- Communication
- Computer Networks and Communications