TY - GEN
T1 - Shape from specular reflection in calibrated environments and the integration of spatial normal fields
AU - Balzer, Jonathan
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2011/9
Y1 - 2011/9
N2 - Reflections of a scene in a mirror surface contain information on its shape. This information is accessible by measurement through an optical metrology technique called deflectometry. The result is a field of normal vectors to the unknown surface having the remarkable property that it equally changes in all spatial directions, unlike normal maps occurring, e.g., in Shape from Shading. Its integration into a zero-order reconstruction of the surface thus deserves special attention. We develop a novel algorithm for this purpose which is relatively straightforward to implement yet outperforms existing ones in terms of efficiency and robustness. Experimental results on synthetic and real data complement the theoretical discussion. © 2011 IEEE.
AB - Reflections of a scene in a mirror surface contain information on its shape. This information is accessible by measurement through an optical metrology technique called deflectometry. The result is a field of normal vectors to the unknown surface having the remarkable property that it equally changes in all spatial directions, unlike normal maps occurring, e.g., in Shape from Shading. Its integration into a zero-order reconstruction of the surface thus deserves special attention. We develop a novel algorithm for this purpose which is relatively straightforward to implement yet outperforms existing ones in terms of efficiency and robustness. Experimental results on synthetic and real data complement the theoretical discussion. © 2011 IEEE.
UR - http://hdl.handle.net/10754/564427
UR - http://ieeexplore.ieee.org/document/6116071/
UR - http://www.scopus.com/inward/record.url?scp=84856237814&partnerID=8YFLogxK
U2 - 10.1109/ICIP.2011.6116071
DO - 10.1109/ICIP.2011.6116071
M3 - Conference contribution
SN - 9781457713033
SP - 21
EP - 24
BT - 2011 18th IEEE International Conference on Image Processing
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -