Second-level testing revisited and applications to NIST SP800-22

Fabio Pareschi; Riccardo Rovatti; Gianluca Setti

doi:10.1109/ECCTD.2007.4529674

Second-level testing revisited and applications to NIST SP800-22

Fabio Pareschi, Riccardo Rovatti, Gianluca Setti

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

3 Scopus citations

Abstract

The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests. © 2007 IEEE.

Original language	English (US)
Title of host publication	European Conference on Circuit Theory and Design 2007, ECCTD 2007
Publisher	IEEE Computer Society
Pages	627-630
Number of pages	4
ISBN (Print)	1424413427
DOIs	https://doi.org/10.1109/ECCTD.2007.4529674
State	Published - Jan 1 2007
Externally published	Yes

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Generated from Scopus record by KAUST IRTS on 2023-02-15

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10.1109/ECCTD.2007.4529674

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title = "Second-level testing revisited and applications to NIST SP800-22",

abstract = "The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests. {\textcopyright} 2007 IEEE.",

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AU - Rovatti, Riccardo

AU - Setti, Gianluca

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PY - 2007/1/1

Y1 - 2007/1/1

N2 - The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests. © 2007 IEEE.

AB - The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests. © 2007 IEEE.

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EP - 630

BT - European Conference on Circuit Theory and Design 2007, ECCTD 2007

PB - IEEE Computer Society

ER -

Second-level testing revisited and applications to NIST SP800-22

Abstract

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