Second-level testing revisited and applications to NIST SP800-22

Fabio Pareschi, Riccardo Rovatti, Gianluca Setti

Research output: Chapter in Book/Report/Conference proceedingConference contribution

3 Scopus citations


The use of second-level testing to reduce Type II errors in RNG validation was suggested from the very beginning though rarely employed in real-world cases. Yet, as security requirements become more critical and the availability of even faster RNG more commonplace, second-level testing will be key to distinguishing RNGs based on the quality of very large chunks of their output. This paper addresses some principles governing the proper design of second-level tests (i.e. how to divide available data into chunks and how to compute second-level p-values) as well as its implications on the design of the underlying basic tests. © 2007 IEEE.
Original languageEnglish (US)
Title of host publicationEuropean Conference on Circuit Theory and Design 2007, ECCTD 2007
PublisherIEEE Computer Society
Number of pages4
ISBN (Print)1424413427
StatePublished - Jan 1 2007
Externally publishedYes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2023-02-15


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