Scattered surface charge density: A tool for surface characterization

Borislav Naydenov, Mauro Mantega, Ivan Rungger, Stefano Sanvito, John J. Boland

Research output: Contribution to journalArticlepeer-review

7 Scopus citations


We demonstrate the use of nonlocal scanning tunneling spectroscopic measurements to characterize the local structure of adspecies in their states where they are significantly less perturbed by the probe, which is accomplished by mapping the amplitude and phase of the scattered surface charge density. As an example, we study single-H-atom adsorption on the n-type Si(100)-(4 × 2) surface, and demonstrate the existence of two different configurations that are distinguishable using the nonlocal approach and successfully corroborated by density functional theory. © 2011 American Physical Society.
Original languageEnglish (US)
JournalPhysical Review B
Issue number19
StatePublished - Nov 28 2011
Externally publishedYes

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledgements: J.J.B. and S. S. acknowledge the Science Foundation Ireland funded Principal Investigator Awards (Grant No. 06/IN.1/I106, Grant No. 07/IN.1/I945) and CRANN. I. R. acknowledges funding from KAUST. Computational resources have been provided by the HEA IITAC project managed by the Trinity Center for High Performance Computing and by ICHEC.
This publication acknowledges KAUST support, but has no KAUST affiliated authors.


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