Scanning ultrafast electron microscopy

Ding Shyue Yang, Omar F. Mohammed, Ahmed H. Zewail

Research output: Contribution to journalArticlepeer-review

106 Scopus citations


Progress has been made in the development of four-dimensional ultrafast electron microscopy, which enables space-time imaging of structural dynamics in the condensed phase. In ultrafast electron microscopy, the electrons are accelerated, typically to 200 keV, and the microscope operates in the transmission mode. Here,we report the development of scanning ultrafast electron microscopy using a field-emission-source configuration. Scanning of pulses is made in the single-electron mode, for which the pulse contains at most one or a few electrons, thus achieving imaging without the space-charge effect between electrons, and still in ten(s) of seconds. For imaging, the secondary electrons from surface structures are detected, as demonstrated here for material surfaces and biological specimens. By recording backscattered electrons, diffraction patterns from single crystals were also obtained. Scanning pulsed-electron microscopy with the acquired spatiotemporal resolutions, and its efficient heat-dissipation feature, is now poised to provide in situ 4D imaging and with environmental capability.

Original languageEnglish (US)
Pages (from-to)14993-14998
Number of pages6
JournalProceedings of the National Academy of Sciences of the United States of America
Issue number34
StatePublished - Aug 24 2010
Externally publishedYes


  • Biological imaging
  • Nanomaterials imaging
  • Schottky emission source
  • Structural dynamics

ASJC Scopus subject areas

  • General


Dive into the research topics of 'Scanning ultrafast electron microscopy'. Together they form a unique fingerprint.

Cite this