Reliability Evaluation of Superluminescent Diodes in Space Environment Based on Bayesian Networks

Zhaofeng Zhen; Yu Han; Xiuhai Cui; Hao Jiang; Yang Song; Jianqun Yang; Weiqi Li; Xingji Li

doi:10.1109/TNS.2022.3213364

Reliability Evaluation of Superluminescent Diodes in Space Environment Based on Bayesian Networks

Zhaofeng Zhen, Yu Han, Xiuhai Cui, Hao Jiang, Yang Song, Jianqun Yang, Weiqi Li, Xingji Li

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1 Scopus citations

Abstract

Reliability evaluation of electronic systems in space environment is a critical issue. In this work, reliability evaluation of superluminescent diode (SLD) systems, which are sensitive to both displacement damage effects and charge-discharge effects, was investigated by the Bayesian network model. Displacement equivalence model of the SLDs is verified by the irradiation results of 5-MeV protons and 1-MeV electrons. Charge-discharge effects of SLDs are induced by 110-keV electrons. Orbital energy spectra and cumulative distribution functions for the equivalent irradiation fluence are calculated by self-built software. Based on the experimental and calculated results, the Bayesian networks under various conditions are established. The probabilities of the type of faults prone in the system under each condition can then be analyzed and quantified. The proposed method provides a good idea for on-orbit reliability evaluation of complex systems.

Original language	English (US)
Pages (from-to)	2214-2221
Number of pages	8
Journal	IEEE Transactions on Nuclear Science
Volume	69
Issue number	11
DOIs	https://doi.org/10.1109/TNS.2022.3213364
State	Published - Nov 1 2022
Externally published	Yes

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title = "Reliability Evaluation of Superluminescent Diodes in Space Environment Based on Bayesian Networks",

abstract = "Reliability evaluation of electronic systems in space environment is a critical issue. In this work, reliability evaluation of superluminescent diode (SLD) systems, which are sensitive to both displacement damage effects and charge-discharge effects, was investigated by the Bayesian network model. Displacement equivalence model of the SLDs is verified by the irradiation results of 5-MeV protons and 1-MeV electrons. Charge-discharge effects of SLDs are induced by 110-keV electrons. Orbital energy spectra and cumulative distribution functions for the equivalent irradiation fluence are calculated by self-built software. Based on the experimental and calculated results, the Bayesian networks under various conditions are established. The probabilities of the type of faults prone in the system under each condition can then be analyzed and quantified. The proposed method provides a good idea for on-orbit reliability evaluation of complex systems.",

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AU - Zhen, Zhaofeng

AU - Han, Yu

AU - Cui, Xiuhai

AU - Jiang, Hao

AU - Song, Yang

AU - Yang, Jianqun

AU - Li, Weiqi

AU - Li, Xingji

N1 - Generated from Scopus record by KAUST IRTS on 2023-09-21

PY - 2022/11/1

Y1 - 2022/11/1

N2 - Reliability evaluation of electronic systems in space environment is a critical issue. In this work, reliability evaluation of superluminescent diode (SLD) systems, which are sensitive to both displacement damage effects and charge-discharge effects, was investigated by the Bayesian network model. Displacement equivalence model of the SLDs is verified by the irradiation results of 5-MeV protons and 1-MeV electrons. Charge-discharge effects of SLDs are induced by 110-keV electrons. Orbital energy spectra and cumulative distribution functions for the equivalent irradiation fluence are calculated by self-built software. Based on the experimental and calculated results, the Bayesian networks under various conditions are established. The probabilities of the type of faults prone in the system under each condition can then be analyzed and quantified. The proposed method provides a good idea for on-orbit reliability evaluation of complex systems.

AB - Reliability evaluation of electronic systems in space environment is a critical issue. In this work, reliability evaluation of superluminescent diode (SLD) systems, which are sensitive to both displacement damage effects and charge-discharge effects, was investigated by the Bayesian network model. Displacement equivalence model of the SLDs is verified by the irradiation results of 5-MeV protons and 1-MeV electrons. Charge-discharge effects of SLDs are induced by 110-keV electrons. Orbital energy spectra and cumulative distribution functions for the equivalent irradiation fluence are calculated by self-built software. Based on the experimental and calculated results, the Bayesian networks under various conditions are established. The probabilities of the type of faults prone in the system under each condition can then be analyzed and quantified. The proposed method provides a good idea for on-orbit reliability evaluation of complex systems.

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JO - IEEE Transactions on Nuclear Science

JF - IEEE Transactions on Nuclear Science

IS - 11

ER -

Reliability Evaluation of Superluminescent Diodes in Space Environment Based on Bayesian Networks

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