TY - GEN
T1 - Refractive shape from light field distortion
AU - Wetzstein, Gordon
AU - Roodnick, David
AU - Heidrich, Wolfgang
AU - Raskar, Ramesh
PY - 2011
Y1 - 2011
N2 - Acquiring transparent, refractive objects is challenging as these kinds of objects can only be observed by analyzing the distortion of reference background patterns. We present a new, single image approach to reconstructing thin transparent surfaces, such as thin solids or surfaces of fluids. Our method is based on observing the distortion of light field background illumination. Light field probes have the potential to encode up to four dimensions in varying colors and intensities: spatial and angular variation on the probe surface; commonly employed reference patterns are only two-dimensional by coding either position or angle on the probe. We show that the additional information can be used to reconstruct refractive surface normals and a sparse set of control points from a single photograph.
AB - Acquiring transparent, refractive objects is challenging as these kinds of objects can only be observed by analyzing the distortion of reference background patterns. We present a new, single image approach to reconstructing thin transparent surfaces, such as thin solids or surfaces of fluids. Our method is based on observing the distortion of light field background illumination. Light field probes have the potential to encode up to four dimensions in varying colors and intensities: spatial and angular variation on the probe surface; commonly employed reference patterns are only two-dimensional by coding either position or angle on the probe. We show that the additional information can be used to reconstruct refractive surface normals and a sparse set of control points from a single photograph.
UR - http://www.scopus.com/inward/record.url?scp=84856635800&partnerID=8YFLogxK
U2 - 10.1109/ICCV.2011.6126367
DO - 10.1109/ICCV.2011.6126367
M3 - Conference contribution
AN - SCOPUS:84856635800
SN - 9781457711015
T3 - Proceedings of the IEEE International Conference on Computer Vision
SP - 1180
EP - 1186
BT - 2011 International Conference on Computer Vision, ICCV 2011
T2 - 2011 IEEE International Conference on Computer Vision, ICCV 2011
Y2 - 6 November 2011 through 13 November 2011
ER -