Recording performance of discrete track patterned media fabricated by focused ion beam

Y. J. Chen*, K. W. Ng, S. H. Leong, Z. B. Guo, J. Z. Shi, B. Liu

*Corresponding author for this work

Research output: Contribution to journalArticlepeer-review

9 Scopus citations

Abstract

We report on the recording performance of discrete track patterned media fabricated by focused ion beam (FIB). We investigated performance over a small area by spinstand read/write testing. Discrete track patterned regions show smaller magnetic track width and better signal separation between adjacent tracks and therefore higher track density than that of nonpatterned continuous media as a result of reduced side fringe effect and edge noise. We found that, at a designed groove depth of 4-8 nm, the shallow FIB etched grooves already provide good isolation between adjacent tracks, indicating the superiority of ion beam induced modification of magnetic properties in film media over physical modification of disk surface topography. This has implications for discrete track recording and media fabrication.

Original languageEnglish (US)
Pages (from-to)2195-2198
Number of pages4
JournalIEEE Transactions on Magnetics
Volume41
Issue number6
DOIs
StatePublished - Jun 2005
Externally publishedYes

Keywords

  • Discrete track media
  • FIB lithography
  • High track density
  • Recording performance

ASJC Scopus subject areas

  • Electronic, Optical and Magnetic Materials
  • Electrical and Electronic Engineering

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