Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution

Jonas Kühn; Tristan Colomb; Christophe Pache; Florian Charrière; Frédéric Montfort; Etienne Cuche; Yves Emery; Pierre Marquet; Christian Depeursinge

doi:10.1117/12.763291

Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution

Jonas Kühn^*, Tristan Colomb, Christophe Pache, Florian Charrière, Frédéric Montfort, Etienne Cuche, Yves Emery, Pierre Marquet, Christian Depeursinge

^*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

6 Scopus citations

Abstract

We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique real-time capability of our technique, it is shown that axial resolution can be further increased compared to single-wavelength operation thanks to the uncorrelated nature of both recorded wavefronts. It is experimentally demonstrated that DHM topographic investigation within 3 decades measurement range can be achieved with our arrangement, opening new applications possibilities for this interferometric technique.

Original language	English (US)
Title of host publication	Three-Dimensional and Multidimensional Microscopy
Subtitle of host publication	Image Acquisition and Processing XV
Volume	6861
DOIs	https://doi.org/10.1117/12.763291
State	Published - 2008
Externally published	Yes
Event	Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV - San Jose, CA, United States Duration: Jan 21 2008 → Jan 24 2008

Other

Other	Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV
Country/Territory	United States
City	San Jose, CA
Period	01/21/08 → 01/24/08

Keywords

Beat-wavelength
Digital holography
Dual-wavelength
Phase microscopy
Two-wavelengths

ASJC Scopus subject areas

Engineering(all)

Access to Document

10.1117/12.763291

Cite this

Kühn, J., Colomb, T., Pache, C., Charrière, F., Montfort, F., Cuche, E., Emery, Y., Marquet, P., & Depeursinge, C. (2008). Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution. In Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV (Vol. 6861). [68610J] https://doi.org/10.1117/12.763291

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title = "Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution",

abstract = "We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique real-time capability of our technique, it is shown that axial resolution can be further increased compared to single-wavelength operation thanks to the uncorrelated nature of both recorded wavefronts. It is experimentally demonstrated that DHM topographic investigation within 3 decades measurement range can be achieved with our arrangement, opening new applications possibilities for this interferometric technique.",

keywords = "Beat-wavelength, Digital holography, Dual-wavelength, Phase microscopy, Two-wavelengths",

author = "Jonas K{\"u}hn and Tristan Colomb and Christophe Pache and Florian Charri{\`e}re and Fr{\'e}d{\'e}ric Montfort and Etienne Cuche and Yves Emery and Pierre Marquet and Christian Depeursinge",

year = "2008",

doi = "10.1117/12.763291",

language = "English (US)",

isbn = "9780819470362",

volume = "6861",

booktitle = "Three-Dimensional and Multidimensional Microscopy",

note = "Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV ; Conference date: 21-01-2008 Through 24-01-2008",

}

Kühn, J, Colomb, T, Pache, C, Charrière, F, Montfort, F, Cuche, E, Emery, Y, Marquet, P & Depeursinge, C 2008, Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution. in Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV. vol. 6861, 68610J, Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV, San Jose, CA, United States, 01/21/08. https://doi.org/10.1117/12.763291

Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution. / Kühn, Jonas; Colomb, Tristan; Pache, Christophe et al.
Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV. Vol. 6861 2008. 68610J.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution › peer-review

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T1 - Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution

AU - Kühn, Jonas

AU - Colomb, Tristan

AU - Pache, Christophe

AU - Charrière, Florian

AU - Montfort, Frédéric

AU - Cuche, Etienne

AU - Emery, Yves

AU - Marquet, Pierre

AU - Depeursinge, Christian

PY - 2008

Y1 - 2008

N2 - We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique real-time capability of our technique, it is shown that axial resolution can be further increased compared to single-wavelength operation thanks to the uncorrelated nature of both recorded wavefronts. It is experimentally demonstrated that DHM topographic investigation within 3 decades measurement range can be achieved with our arrangement, opening new applications possibilities for this interferometric technique.

AB - We report on advanced dual-wavelength digital holographic microscopy (DHM) methods, enabling single-acquisition real-time micron-range measurements while maintaining single-wavelength interferometric resolution in the nanometer regime. In top of the unique real-time capability of our technique, it is shown that axial resolution can be further increased compared to single-wavelength operation thanks to the uncorrelated nature of both recorded wavefronts. It is experimentally demonstrated that DHM topographic investigation within 3 decades measurement range can be achieved with our arrangement, opening new applications possibilities for this interferometric technique.

KW - Beat-wavelength

KW - Digital holography

KW - Dual-wavelength

KW - Phase microscopy

KW - Two-wavelengths

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DO - 10.1117/12.763291

M3 - Conference contribution

AN - SCOPUS:42149109076

SN - 9780819470362

VL - 6861

BT - Three-Dimensional and Multidimensional Microscopy

T2 - Three-Dimensional and Multidimensional Microscopy: Image Acquisition and Processing XV

Y2 - 21 January 2008 through 24 January 2008

ER -

Real-time dual-wavelength digital holographic microscopy for extended measurement range with enhanced axial resolution

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Keywords

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