Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Riya Bose; Jingya Sun; Jafar Iqbal Khan; Basamat S. Shaheen; Aniruddha Adhikari; Tien Khee Ng; Victor M. Burlakov; Manas R. Parida; Davide Priante; Alain Goriely; Boon S. Ooi; Osman Bakr; Omar F. Mohammed

doi:10.1002/adma.201600202

Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Riya Bose, Jingya Sun, Jafar Iqbal Khan, Basamat S. Shaheen, Aniruddha Adhikari, Tien Khee Ng, Victor M. Burlakov, Manas R. Parida, Davide Priante, Alain Goriely, Boon S. Ooi, Osman Bakr, Omar F. Mohammed

Research output: Contribution to journal › Article › peer-review

30 Scopus citations

Abstract

A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.

Original language	English (US)
Pages (from-to)	5106-5111
Number of pages	6
Journal	Advanced Materials
Volume	28
Issue number	25
DOIs	https://doi.org/10.1002/adma.201600202
State	Published - Apr 25 2016

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledgements: R.B. and J.S. contributed equally to this work. The work was supported by the King Abdullah University of Science and Technology (KAUST) and King Abdulaziz City for Science and Technology TIC (Technology Innovation Center) for Solid-State Lighting at KAUST. T.K.N. and B.S.O. gratefully acknowledge contribution from Pallab Bhattacharya, University of Michigan, USA. T.K.N. and D.P. gratefully acknowledge Rami T. Elafandy (Photonics Laboratory, KAUST) for the effort and assistance in scanning electron microscopy experiments. The authors declare no competing financial interests.

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Bose, R., Sun, J., Khan, J. I., Shaheen, B. S., Adhikari, A., Ng, T. K., Burlakov, V. M., Parida, M. R., Priante, D., Goriely, A., Ooi, B. S., Bakr, O., & Mohammed, O. F. (2016). Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy. Advanced Materials, 28(25), 5106-5111. https://doi.org/10.1002/adma.201600202

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title = "Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy",

abstract = "A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.",

author = "Riya Bose and Jingya Sun and Khan, {Jafar Iqbal} and Shaheen, {Basamat S.} and Aniruddha Adhikari and Ng, {Tien Khee} and Burlakov, {Victor M.} and Parida, {Manas R.} and Davide Priante and Alain Goriely and Ooi, {Boon S.} and Osman Bakr and Mohammed, {Omar F.}",

note = "KAUST Repository Item: Exported on 2020-10-01 Acknowledgements: R.B. and J.S. contributed equally to this work. The work was supported by the King Abdullah University of Science and Technology (KAUST) and King Abdulaziz City for Science and Technology TIC (Technology Innovation Center) for Solid-State Lighting at KAUST. T.K.N. and B.S.O. gratefully acknowledge contribution from Pallab Bhattacharya, University of Michigan, USA. T.K.N. and D.P. gratefully acknowledge Rami T. Elafandy (Photonics Laboratory, KAUST) for the effort and assistance in scanning electron microscopy experiments. The authors declare no competing financial interests.",

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doi = "10.1002/adma.201600202",

language = "English (US)",

volume = "28",

pages = "5106--5111",

journal = "Advanced Materials",

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AU - Sun, Jingya

AU - Khan, Jafar Iqbal

AU - Shaheen, Basamat S.

AU - Adhikari, Aniruddha

AU - Ng, Tien Khee

AU - Burlakov, Victor M.

AU - Parida, Manas R.

AU - Priante, Davide

AU - Goriely, Alain

AU - Ooi, Boon S.

AU - Bakr, Osman

AU - Mohammed, Omar F.

N1 - KAUST Repository Item: Exported on 2020-10-01 Acknowledgements: R.B. and J.S. contributed equally to this work. The work was supported by the King Abdullah University of Science and Technology (KAUST) and King Abdulaziz City for Science and Technology TIC (Technology Innovation Center) for Solid-State Lighting at KAUST. T.K.N. and B.S.O. gratefully acknowledge contribution from Pallab Bhattacharya, University of Michigan, USA. T.K.N. and D.P. gratefully acknowledge Rami T. Elafandy (Photonics Laboratory, KAUST) for the effort and assistance in scanning electron microscopy experiments. The authors declare no competing financial interests.

PY - 2016/4/25

Y1 - 2016/4/25

N2 - A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.

AB - A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.

UR - http://hdl.handle.net/10754/621621

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JO - Advanced Materials

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Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

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