Real-Space Visualization of Energy Loss and Carrier Diffusion in a Semiconductor Nanowire Array Using 4D Electron Microscopy

Riya Bose, Jingya Sun, Jafar Iqbal Khan, Basamat S. Shaheen, Aniruddha Adhikari, Tien Khee Ng, Victor M. Burlakov, Manas R. Parida, Davide Priante, Alain Goriely, Boon S. Ooi, Osman Bakr, Omar F. Mohammed

Research output: Contribution to journalArticlepeer-review

28 Scopus citations

Abstract

A breakthrough in the development of 4D scanning ultrafast electron microscopy is described for real-time and space imaging of secondary electron energy loss and carrier diffusion on the surface of an array of nanowires as a model system, providing access to a territory that is beyond the reach of either static electron imaging or any time-resolved laser spectroscopy.
Original languageEnglish (US)
Pages (from-to)5106-5111
Number of pages6
JournalAdvanced Materials
Volume28
Issue number25
DOIs
StatePublished - Apr 25 2016

Bibliographical note

KAUST Repository Item: Exported on 2020-10-01
Acknowledgements: R.B. and J.S. contributed equally to this work. The work was supported by the King Abdullah University of Science and Technology (KAUST) and King Abdulaziz City for Science and Technology TIC (Technology Innovation Center) for Solid-State Lighting at KAUST. T.K.N. and B.S.O. gratefully acknowledge contribution from Pallab Bhattacharya, University of Michigan, USA. T.K.N. and D.P. gratefully acknowledge Rami T. Elafandy (Photonics Laboratory, KAUST) for the effort and assistance in scanning electron microscopy experiments. The authors declare no competing financial interests.

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