Abstract
In 2 O 3 is one of the most important semiconducting metal oxides primarily because of its wide band gap, high electron mobility and processing versatility. To this end, high-quality thin films of In 2 O 3 can be prepared using scalable and inexpensive solution-based deposition methods, hence making it attractive for application in a number of emerging electronic applications. However, traditional solution processing often requires high temperature and lengthy annealing steps, making it impossible to use in combination with temperature-sensitive plastic substrates, which would be desired for numerous emerging flexible device applications. Here, rapid photonic curing of In 2 O 3 layers is explored as an alternative to thermal annealing. Oxide thin films are successfully prepared on a range of substrates, including glass, polyimide, and polyethylene naphthalate. The effect of substrate and post-processing treatment on the morphology, surface chemistry, and electronic properties is investigated by atomic force microscopy and X-ray photoelectron spectroscopy. Systematic trends are identified, particularly in the degree of conversion of the precursor and its influence on the electronic structure.
Original language | English (US) |
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Pages (from-to) | 974-979 |
Number of pages | 6 |
Journal | Applied Surface Science |
Volume | 479 |
DOIs | |
State | Published - Jun 15 2019 |
Bibliographical note
Publisher Copyright:© 2019 Elsevier B.V.
Keywords
- Atomic force microscopy
- Photonic curing
- Sol-gel
- Transparent conducting oxide
- X-ray photoelectron spectroscopy
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- Surfaces, Coatings and Films
- General Physics and Astronomy
- Surfaces and Interfaces