Abstract
We revisit the common practice of evaluating adaptation of Online Continual Learning (OCL) algorithms through the metric of online accuracy, which measures the accuracy of the model on the immediate next few samples. However, we show that this metric is unreliable, as even vacuous blind classifiers, which do not use input images for prediction, can achieve unrealistically high online accuracy by exploiting spurious label correlations in the data stream. Our study reveals that existing OCL algorithms can also achieve high online accuracy, but perform poorly in retaining useful information, suggesting that they unintentionally learn spurious label correlations. To address this issue, we propose a novel metric for measuring adaptation based on the accuracy on the near-future samples, where spurious correlations are removed. We benchmark existing OCL approaches using our proposed metric on large-scale datasets under various computational budgets and find that better generalization can be achieved by retaining and reusing past seen information. We believe that our proposed metric can aid in the development of truly adaptive OCL methods. We provide code to reproduce our results at https://github.com/drimpossible/EvalOCL.
Original language | English (US) |
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Title of host publication | Proceedings - 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 |
Publisher | Institute of Electrical and Electronics Engineers Inc. |
Pages | 18806-18815 |
Number of pages | 10 |
ISBN (Electronic) | 9798350307184 |
DOIs | |
State | Published - 2023 |
Event | 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 - Paris, France Duration: Oct 2 2023 → Oct 6 2023 |
Publication series
Name | Proceedings of the IEEE International Conference on Computer Vision |
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ISSN (Print) | 1550-5499 |
Conference
Conference | 2023 IEEE/CVF International Conference on Computer Vision, ICCV 2023 |
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Country/Territory | France |
City | Paris |
Period | 10/2/23 → 10/6/23 |
Bibliographical note
Publisher Copyright:© 2023 IEEE.
ASJC Scopus subject areas
- Software
- Computer Vision and Pattern Recognition