TY - GEN
T1 - RAID-6 reed-solomon codes with asymptotically optimal arithmetic complexities
AU - Lin, Sian Jheng
AU - Alloum, Amira
AU - Al-Naffouri, Tareq Y.
N1 - KAUST Repository Item: Exported on 2020-10-01
PY - 2016/12/24
Y1 - 2016/12/24
N2 - In computer storage, RAID 6 is a level of RAID that can tolerate two failed drives. When RAID-6 is implemented by Reed-Solomon (RS) codes, the penalty of the writing performance is on the field multiplications in the second parity. In this paper, we present a configuration of the factors of the second-parity formula, such that the arithmetic complexity can reach the optimal complexity bound when the code length approaches infinity. In the proposed approach, the intermediate data used for the first parity is also utilized to calculate the second parity. To the best of our knowledge, this is the first approach supporting the RAID-6 RS codes to approach the optimal arithmetic complexity.
AB - In computer storage, RAID 6 is a level of RAID that can tolerate two failed drives. When RAID-6 is implemented by Reed-Solomon (RS) codes, the penalty of the writing performance is on the field multiplications in the second parity. In this paper, we present a configuration of the factors of the second-parity formula, such that the arithmetic complexity can reach the optimal complexity bound when the code length approaches infinity. In the proposed approach, the intermediate data used for the first parity is also utilized to calculate the second parity. To the best of our knowledge, this is the first approach supporting the RAID-6 RS codes to approach the optimal arithmetic complexity.
UR - http://hdl.handle.net/10754/622592
UR - http://ieeexplore.ieee.org/document/7794681/
UR - http://www.scopus.com/inward/record.url?scp=85010070424&partnerID=8YFLogxK
U2 - 10.1109/PIMRC.2016.7794681
DO - 10.1109/PIMRC.2016.7794681
M3 - Conference contribution
SN - 9781509032549
BT - 2016 IEEE 27th Annual International Symposium on Personal, Indoor, and Mobile Radio Communications (PIMRC)
PB - Institute of Electrical and Electronics Engineers (IEEE)
ER -