Abstract
A method is proposed for controlling degradation processes and the reliability of electronic devices with the aid of a system of informative parameters. Application of γ radiation improves the sensitivity of the method.
Original language | English (US) |
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Pages (from-to) | 61-64 |
Number of pages | 4 |
Journal | Measurement Techniques |
Volume | 41 |
Issue number | 1 |
DOIs | |
State | Published - Jan 1998 |
Externally published | Yes |
ASJC Scopus subject areas
- Instrumentation
- Applied Mathematics