Radio engineering measurements: Control of degradation processes in electronic devices and prediction of their reliability

V. K. Aladinskii, A. R. Kasimov

Research output: Contribution to journalArticlepeer-review

Abstract

A method is proposed for controlling degradation processes and the reliability of electronic devices with the aid of a system of informative parameters. Application of γ radiation improves the sensitivity of the method.

Original languageEnglish (US)
Pages (from-to)61-64
Number of pages4
JournalMeasurement Techniques
Volume41
Issue number1
DOIs
StatePublished - Jan 1998
Externally publishedYes

ASJC Scopus subject areas

  • Instrumentation
  • Applied Mathematics

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