Abstract
Transparent lanthanum-modified lead zirconate titanate (PLZT) thin films with electro-optic properties were deposited on indium-doped tin oxide (ITO) coated glass by pulsed laser deposition (PLD). Stoichiometric films with the crystallographic perovskite structure required for electro-optical behaviour, and a composition ratio close to 9/65/35 were obtained. The microstructural, optical and electro-optic properties of these films were studied for different substrate temperatures, T s , and reactor oxygen pressure, P O2 . The films annealed at 700°C in oxygen at atmospheric pressure are highly (110) perovskite orientated and free of the undesired pyrochlore phase. The optical constants (n and k as a function of wavelength) of the films were obtained using variable angle spectroscopic ellipsometry (VASE) and spectrophotometry in the UV-Vis-NIR regions. They appear to be strongly depending on the deposition conditions. A high quadratic electro-optic coefficient, close to that of the bulk value, was obtained at 632.8nm by single-beam (ellipsometric) configuration.
| Original language | English (US) |
|---|---|
| Pages (from-to) | 347-354 |
| Number of pages | 8 |
| Journal | Applied Surface Science |
| Volume | 226 |
| Issue number | 4 |
| DOIs | |
| State | Published - Mar 30 2004 |
| Externally published | Yes |
Keywords
- Electro-optic
- PLD
- PLZT (9/65/35)
- Surface morphology
- XRD
ASJC Scopus subject areas
- General Chemistry
- Condensed Matter Physics
- Surfaces, Coatings and Films
- General Physics and Astronomy
- Surfaces and Interfaces