Properties of a submicrometer x-ray beam at the exit of a waveguide

Werner Jark; Silvia Di Fonzo; Stefano Lagomarsino; Alessia Cedola; Enzo Di Fabrizio; Andreas Bram; Christian Riekel

doi:10.1063/1.363524

Properties of a submicrometer x-ray beam at the exit of a waveguide

Werner Jark^*, Silvia Di Fonzo, Stefano Lagomarsino, Alessia Cedola, Enzo Di Fabrizio, Andreas Bram, Christian Riekel

^*Corresponding author for this work

Research output: Contribution to journal › Article › peer-review

68 Scopus citations

Abstract

This report discusses the properties of a 13-keV submicrometer x-ray beam exiting from a waveguide. Waveguides for this spectral regime can be constructed by enclosing a low-absorbing material between highly absorbant metals. Best performance is found for about 0.1 μm guiding layer thickness. Measurements of the photon beam size close to the exit and of the intensity distribution far from the exit will be presented. From these data one derives a beam size at the exit which is identical to the guiding layer thickness. This number being in the submicrometer range offers interesting perspectives for microscopy experiments in the hard x-ray range.

Original language	English (US)
Pages (from-to)	4831-4836
Number of pages	6
Journal	Journal of Applied Physics
Volume	80
Issue number	9
DOIs	https://doi.org/10.1063/1.363524
State	Published - Nov 1 1996
Externally published	Yes

ASJC Scopus subject areas

General Physics and Astronomy

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title = "Properties of a submicrometer x-ray beam at the exit of a waveguide",

abstract = "This report discusses the properties of a 13-keV submicrometer x-ray beam exiting from a waveguide. Waveguides for this spectral regime can be constructed by enclosing a low-absorbing material between highly absorbant metals. Best performance is found for about 0.1 μm guiding layer thickness. Measurements of the photon beam size close to the exit and of the intensity distribution far from the exit will be presented. From these data one derives a beam size at the exit which is identical to the guiding layer thickness. This number being in the submicrometer range offers interesting perspectives for microscopy experiments in the hard x-ray range.",

author = "Werner Jark and {Di Fonzo}, Silvia and Stefano Lagomarsino and Alessia Cedola and {Di Fabrizio}, Enzo and Andreas Bram and Christian Riekel",

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AU - Jark, Werner

AU - Di Fonzo, Silvia

AU - Lagomarsino, Stefano

AU - Cedola, Alessia

AU - Di Fabrizio, Enzo

AU - Bram, Andreas

AU - Riekel, Christian

PY - 1996/11/1

Y1 - 1996/11/1

N2 - This report discusses the properties of a 13-keV submicrometer x-ray beam exiting from a waveguide. Waveguides for this spectral regime can be constructed by enclosing a low-absorbing material between highly absorbant metals. Best performance is found for about 0.1 μm guiding layer thickness. Measurements of the photon beam size close to the exit and of the intensity distribution far from the exit will be presented. From these data one derives a beam size at the exit which is identical to the guiding layer thickness. This number being in the submicrometer range offers interesting perspectives for microscopy experiments in the hard x-ray range.

AB - This report discusses the properties of a 13-keV submicrometer x-ray beam exiting from a waveguide. Waveguides for this spectral regime can be constructed by enclosing a low-absorbing material between highly absorbant metals. Best performance is found for about 0.1 μm guiding layer thickness. Measurements of the photon beam size close to the exit and of the intensity distribution far from the exit will be presented. From these data one derives a beam size at the exit which is identical to the guiding layer thickness. This number being in the submicrometer range offers interesting perspectives for microscopy experiments in the hard x-ray range.

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VL - 80

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EP - 4836

JO - Journal of Applied Physics

JF - Journal of Applied Physics

IS - 9

ER -

Properties of a submicrometer x-ray beam at the exit of a waveguide

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