Abstract
In this work, the electrical capacitance tomography (ECT) technique is applied in monitoring internal deformation of geological analog models, which are used to study structural deformation mechanisms, in particular for simulating migration and emplacement of allochtonous salt bodies. A rectangular ECT sensor was used for internal visualization of analog geologic deformation. The monitoring of analog models consists in the reconstruction of permittivity images from the capacitance measurements obtained by introducing the model inside the ECT sensor. A simulated annealing (SA) algorithm is used as a reconstruction method, and is optimized by taking full advantage of some special features in a linearized version of this inverse approach. As a second part of this work our SA image reconstruction algorithm is applied to synthetic models, where its performance is evaluated in comparison to other commonly used algorithms such as linear back-projection and iterative Landweber methods. Finally, the SA method is applied to visualise two simple geological analog models. Encouraging results were obtained in terms of the quality of the reconstructed images, as interfaces corresponding to main geological units in the analog model were clearly distinguishable in them. We found reliable results quite useful for real time non-invasive monitoring of internal deformation of analog geological models.
Original language | English (US) |
---|---|
Article number | 065401 |
Journal | Measurement Science and Technology |
Volume | 28 |
Issue number | 6 |
DOIs | |
State | Published - May 11 2017 |
Bibliographical note
Funding Information:Authors acknowledge EDI grant and projects 20171536, 20170721, all provided by SIP/IPN. This research was partially supported by projects SENER-CONACyT 128376, SIP 20160105 and SIP 20160576 (IPN). AEC acknowledges 90485 scholarship by IMP.
Publisher Copyright:
© 2017 IOP Publishing Ltd.
Keywords
- analog geological models
- congugate gradient
- ECT
- electrical capacitance tomography
- imaging
- simulated annealing
- tomography
ASJC Scopus subject areas
- Instrumentation
- Engineering (miscellaneous)
- Applied Mathematics