Point sampling with uniformly distributed lines

J. Rovira*, P. Wonka, F. Castro, M. Sbert

*Corresponding author for this work

Research output: Chapter in Book/Report/Conference proceedingConference contributionpeer-review

14 Scopus citations


In this paper we address the problem of extracting representative point samples from polygonal models. The goal of such a sampling algorithm is to find points that are evenly distributed. We propose star-discrepancy as a measure for sampling quality and propose new sampling methods based on global line distributions. We investigate several line generation algorithms including an efficient hardware-based sampling method. Our method contributes to the area of point-based graphics by extracting points that are more evenly distributed than by sampling with current algorithms.

Original languageEnglish (US)
Title of host publicationPoint-Based Graphics, 2005 - Eurographics/IEEE VGTC Symposium Proceedings
PublisherInstitute of Electrical and Electronics Engineers Inc.
Number of pages10
ISBN (Print)3905673207, 9783905673203
StatePublished - 2005
Externally publishedYes
EventEurographics/IEEE VGTC Symposium on Point-Based Graphics, 2005 - Stony Brook, NY, United States
Duration: Jun 20 2005Jun 21 2005

Publication series

NamePoint-Based Graphics, 2005 - Eurographics/IEEE VGTC Symposium Proceedings


OtherEurographics/IEEE VGTC Symposium on Point-Based Graphics, 2005
Country/TerritoryUnited States
CityStony Brook, NY

ASJC Scopus subject areas

  • General Engineering


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