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Dive into the research topics of 'Origin and suppression of V-shaped defects in the capping of self-assembled InAs quantum dots on graded Si1-xGex /Si substrate'. Together they form a unique fingerprint.- Sort by
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H. Tanoto*, S. F. Yoon, T. K. Ng, C. Y. Ngo, C. Dohrman, E. A. Fitzgerald, L. H. Tan, C. H. Tung
Research output: Contribution to journal › Article › peer-review