Optical properties of Er3+-doped SiO2-GeO2-Al2O3 planar waveguide fabricated by sol-gel processes

Q. Xiang; Y. Zhou; B. S. Ooi; Y. L. Lam; Y. C. Chan; C. H. Kam

doi:10.1016/S0040-6090(00)00915-9

Optical properties of Er³⁺-doped SiO₂-GeO₂-Al₂O₃ planar waveguide fabricated by sol-gel processes

Q. Xiang, Y. Zhou, B. S. Ooi, Y. L. Lam, Y. C. Chan, C. H. Kam

Research output: Contribution to journal › Article › peer-review

41 Scopus citations

Abstract

In this paper, we report silica based planar waveguides doped with Er³⁺, and co-doped with GeO₂ and Al₂O₃. These sol-gel derived planar waveguides were fabricated on SOS (silica on silicon) using multiple spin-coating and rapid thermal processing (RTP). Investigation has been made on their characteristics in terms of their application in optical amplification and lasing, including photoluminescence (PL), fluorescence lifetime, refractive index, propagation loss, surface roughness, Fourier transform infrared (FTIR) spectrum and X-ray diffraction (XRD) analysis. The propagation loss of a 20-layer planar waveguide was measured to be about 1.6 dB/cm for TE₀ and 2.2 dB/cm for TM₀ mode. A strong emission transition (⁴I_13/2 → ⁴I_15/2) at 1.536 μm with a lifetime of 3.6 ms has been obtained for an optimized molar composition of 90SiO₂:10GeO₂:20AlO_1.5:1ErO_1.5.

Original language	English (US)
Pages (from-to)	243-247
Number of pages	5
Journal	Thin Solid Films
Volume	370
Issue number	1
DOIs	https://doi.org/10.1016/S0040-6090(00)00915-9
State	Published - Jul 17 2000
Externally published	Yes

ASJC Scopus subject areas

Electronic, Optical and Magnetic Materials
Surfaces and Interfaces
Surfaces, Coatings and Films
Metals and Alloys
Materials Chemistry

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10.1016/S0040-6090(00)00915-9

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title = "Optical properties of Er3+-doped SiO2-GeO2-Al2O3 planar waveguide fabricated by sol-gel processes",

abstract = "In this paper, we report silica based planar waveguides doped with Er3+, and co-doped with GeO2 and Al2O3. These sol-gel derived planar waveguides were fabricated on SOS (silica on silicon) using multiple spin-coating and rapid thermal processing (RTP). Investigation has been made on their characteristics in terms of their application in optical amplification and lasing, including photoluminescence (PL), fluorescence lifetime, refractive index, propagation loss, surface roughness, Fourier transform infrared (FTIR) spectrum and X-ray diffraction (XRD) analysis. The propagation loss of a 20-layer planar waveguide was measured to be about 1.6 dB/cm for TE0 and 2.2 dB/cm for TM0 mode. A strong emission transition (4I13/2 → 4I15/2) at 1.536 μm with a lifetime of 3.6 ms has been obtained for an optimized molar composition of 90SiO2:10GeO2:20AlO1.5:1ErO1.5.",

author = "Q. Xiang and Y. Zhou and Ooi, {B. S.} and Lam, {Y. L.} and Chan, {Y. C.} and Kam, {C. H.}",

year = "2000",

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doi = "10.1016/S0040-6090(00)00915-9",

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T1 - Optical properties of Er3+-doped SiO2-GeO2-Al2O3 planar waveguide fabricated by sol-gel processes

AU - Xiang, Q.

AU - Zhou, Y.

AU - Ooi, B. S.

AU - Lam, Y. L.

AU - Chan, Y. C.

AU - Kam, C. H.

PY - 2000/7/17

Y1 - 2000/7/17

N2 - In this paper, we report silica based planar waveguides doped with Er3+, and co-doped with GeO2 and Al2O3. These sol-gel derived planar waveguides were fabricated on SOS (silica on silicon) using multiple spin-coating and rapid thermal processing (RTP). Investigation has been made on their characteristics in terms of their application in optical amplification and lasing, including photoluminescence (PL), fluorescence lifetime, refractive index, propagation loss, surface roughness, Fourier transform infrared (FTIR) spectrum and X-ray diffraction (XRD) analysis. The propagation loss of a 20-layer planar waveguide was measured to be about 1.6 dB/cm for TE0 and 2.2 dB/cm for TM0 mode. A strong emission transition (4I13/2 → 4I15/2) at 1.536 μm with a lifetime of 3.6 ms has been obtained for an optimized molar composition of 90SiO2:10GeO2:20AlO1.5:1ErO1.5.

AB - In this paper, we report silica based planar waveguides doped with Er3+, and co-doped with GeO2 and Al2O3. These sol-gel derived planar waveguides were fabricated on SOS (silica on silicon) using multiple spin-coating and rapid thermal processing (RTP). Investigation has been made on their characteristics in terms of their application in optical amplification and lasing, including photoluminescence (PL), fluorescence lifetime, refractive index, propagation loss, surface roughness, Fourier transform infrared (FTIR) spectrum and X-ray diffraction (XRD) analysis. The propagation loss of a 20-layer planar waveguide was measured to be about 1.6 dB/cm for TE0 and 2.2 dB/cm for TM0 mode. A strong emission transition (4I13/2 → 4I15/2) at 1.536 μm with a lifetime of 3.6 ms has been obtained for an optimized molar composition of 90SiO2:10GeO2:20AlO1.5:1ErO1.5.

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DO - 10.1016/S0040-6090(00)00915-9

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SN - 0040-6090

VL - 370

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JO - Thin Solid Films

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IS - 1

ER -

Optical properties of Er³⁺-doped SiO₂-GeO₂-Al₂O₃ planar waveguide fabricated by sol-gel processes

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