On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite

Fabio Pareschi; Riccardo Rovatti; Gianluca Setti

doi:10.1109/APCCAS.2008.4746245

On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite

Fabio Pareschi, Riccardo Rovatti, Gianluca Setti

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

1 Scopus citations

Abstract

In previous papers we have addressed the problem of testing Random Number Generators (RNGs) through statistical tests, with particular emphasis on the approach we called second-level testing. We have shown that this approach is capable of achieving much higher accuracy in exposing non-random generators, but may suffer from reliability issues due to approximations introduced in the test. Here we consider the NIST Frequency Test and present a mathematical expression of the error introduced by approximating the effective discrete distribution function with its continuous limit distribution. The matching against experimental data is almost perfect. © 2008 IEEE.

Original language	English (US)
Title of host publication	IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	1216-1219
Number of pages	4
ISBN (Print)	9781424423422
DOIs	https://doi.org/10.1109/APCCAS.2008.4746245
State	Published - Jan 1 2008
Externally published	Yes

Bibliographical note

Generated from Scopus record by KAUST IRTS on 2023-02-15

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10.1109/APCCAS.2008.4746245

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title = "On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite",

abstract = "In previous papers we have addressed the problem of testing Random Number Generators (RNGs) through statistical tests, with particular emphasis on the approach we called second-level testing. We have shown that this approach is capable of achieving much higher accuracy in exposing non-random generators, but may suffer from reliability issues due to approximations introduced in the test. Here we consider the NIST Frequency Test and present a mathematical expression of the error introduced by approximating the effective discrete distribution function with its continuous limit distribution. The matching against experimental data is almost perfect. {\textcopyright} 2008 IEEE.",

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On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite. / Pareschi, Fabio; Rovatti, Riccardo; Setti, Gianluca.
IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS. Institute of Electrical and Electronics Engineers Inc., 2008. p. 1216-1219.

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

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T1 - On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite

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AU - Rovatti, Riccardo

AU - Setti, Gianluca

N1 - Generated from Scopus record by KAUST IRTS on 2023-02-15

PY - 2008/1/1

Y1 - 2008/1/1

N2 - In previous papers we have addressed the problem of testing Random Number Generators (RNGs) through statistical tests, with particular emphasis on the approach we called second-level testing. We have shown that this approach is capable of achieving much higher accuracy in exposing non-random generators, but may suffer from reliability issues due to approximations introduced in the test. Here we consider the NIST Frequency Test and present a mathematical expression of the error introduced by approximating the effective discrete distribution function with its continuous limit distribution. The matching against experimental data is almost perfect. © 2008 IEEE.

AB - In previous papers we have addressed the problem of testing Random Number Generators (RNGs) through statistical tests, with particular emphasis on the approach we called second-level testing. We have shown that this approach is capable of achieving much higher accuracy in exposing non-random generators, but may suffer from reliability issues due to approximations introduced in the test. Here we consider the NIST Frequency Test and present a mathematical expression of the error introduced by approximating the effective discrete distribution function with its continuous limit distribution. The matching against experimental data is almost perfect. © 2008 IEEE.

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BT - IEEE Asia-Pacific Conference on Circuits and Systems, Proceedings, APCCAS

PB - Institute of Electrical and Electronics Engineers Inc.

ER -

On the Approximation Errors in the Frequency Test Included in the NIST SP800-22 Statistical Test Suite

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